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Content tagged with Test & Measurement
posted in May 2003
Low-Cost Silicon Smoothes Power-Supply Margin Testing
News & Analysis  
5/13/2003   Post a comment
In manufacturing and test, it's sometimes necessary to test the operation of components at upper and/or lower voltage limits. This is what Linear Technology Corp. (LTC) refers to in its press release as "power-supply margining."
IOtech Hangs 16-Bit 200 kHz Data-Acq Products on the Network
News & Analysis  
5/13/2003   Post a comment
IOtech's sweeping press release says a great deal about these two Linux-based products. But wait, there's more. Note that there are actually three models in each of the families. And, DSP is at play too.
How to generate at-speed scan vectors
Design How-To  
5/9/2003   Post a comment
At-speed testing is needed to detect many kinds of defects, says Bob Neil, consulting engineer at design services firm Paradigm Works. In this tutorial, he compares approaches used by DFT tools to generate at-speed vectors.
Statistical Process Control Can Improve Automated Production Testing -- Part 1: The Adoption of Statistical Process Control
News & Analysis  
5/7/2003   Post a comment
Automated testing usually conjures up images of racks of measurement equipment assembled into automatic test equipment (ATE) systems. Humans using software usually operate this ATE remotely. But initiating a test program, or making connection to a device under test, or zeroing or calibrating a meter still requires manual intervention. Are there alternatives? The answer is an emphatic yes, and statistical process control can ensure that they work.


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