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Content tagged with Test & Measurement
posted in May 2010
SOFTWARE TOOLS - Rapita Systems launches improved version of RapiTime
News & Analysis  
5/28/2010   Post a comment
Rapita Systems Ltd has added new advanced features to RapiTime, the company's tool for the measurement and timing analysis of real-time embedded software. The latest release, RapiTime v2.3, improves execution time measurement, code coverage and worst-case execution time analysis.
SOFTWARE TOOLS - Mentor, Lauterbach team on accelerated hardware/software debug/verification suite
News & Analysis  
5/27/2010   Post a comment
Mentor Graphics Corp. and Lauterbach GmbH have collaborated to deliver a hardware-accelerated software development and debug platform for the verification of Systems-on-Chip (SoCs) and embedded systems.
Do wireless bike speedometers have a standard?
RF & Microwave Designline Blog  
5/27/2010   5 comments
Is there any information out there on the format, frequency, and more?
New loss measurement requirement coming for circuit board fab shops
News & Analysis  
5/27/2010   1 comment
Intel is setting expectations with their circuit board fab houses that loss measurements will become a required performance metric for their high end server circuit boards.
Arbitrary waveform generators produce high sample rate, resolution
Product News  
5/26/2010   1 comment
LeCroy Corp. recently launched the ArbStudio series of arbitrary waveform generators (AWG) capable of generating signals up to 125 MHz with high sample rate, long memory and high resolution, as well as a variety of operating modes, modulation capabilities and a digital pattern generator.
Extreme Design: The old story, but even-more true--It takes a team with disparate skills and dedication to develop a leading-edge product
Design How-To  
5/24/2010   3 comments
A look at the engineers and skills needed for Agilent's Infiniium 90000-X series of 32-GHz analog oscilloscopes
12-bit ADC clocks 3.6 Gsps with nearly invisible noise floor, strong noise power ratio and IMD
Product News  
5/24/2010   Post a comment
National Semiconductor ADC12D1800 family tops out with -147 dBm/Hz NF, 52 dB NPR, -61 dBFS IMD
There's simulation, and then there's simulation
RF & Microwave Designline Blog  
5/21/2010   4 comments
Don’t confuse model-based simulation with real-world simulation-based testing.
PNA-X network analyzer option offers accurate noise figure measurements up to 50 GHz
Product News  
5/21/2010   Post a comment
Agilent has introduced Option 028 to its PNA-X series of microwave network analyzers, allowing highly accurate, source-corrected noise figure measurements of amplifiers, frequency converters and mixers up to 50 GHz.
Debugging SuperSpeed USB software using virtual prototypes
Design How-To  
5/21/2010   Post a comment
This white paper describes how virtual prototype use models for hardware/software verification and the integration of the LeCroy analyzer software into Synopsys' DesignWare SuperSpeed USB verification environments help solve SuperSpeed USB IP development challenges.
Update: FormFactor's CEO, CFO step down
News & Analysis  
5/20/2010   Post a comment
Wafer probe card maker FormFactor announced that both its chief executive and chief financial officer have stepped down, effective immediately. The company did not specify the reasons given for their resignations.
Low-power wireless devices can achieve a reliable wireless link
Design How-To  
5/18/2010   Post a comment
This article examines causes, problems, tradeoffs, and solutions to this ongoing RF-link issue, complete with real-world data
PLS UDE 2.7 tests and debugs Cortex-M4 and Cortex-M3 derivates
News & Analysis  
5/12/2010   Post a comment
New version of PLS UDE 2.7 tests and debugs Cortex-M4 and Cortex-M3 derivates and offers unrestricted C/C++ support, a symbol browser, configurable toolbars, extensive context related menus.
Apache unveils ESD physical integrity tool
Product News  
5/10/2010   Post a comment
Apache Design Solutions Inc. (San Jose, Calif.) has introduced what it claims is the industry’s first electro-static discharge (ESD) integrity solution targeted to address the increasing reliability challenges faced by nanometer designs.
Startup rolls automatic assertion synthesis tool
Product News  
5/6/2010   Post a comment
Santa Clara-based EDA startup NextOp Software Inc. is bridging two worlds, design and verification teams, with the introduction of what it claims is the first assertion-based verification solution to automatically generate high quality assertions and functional coverage properties from testbench and RTL.
Agilent partners with Innowireless on LTE testing
News & Analysis  
5/6/2010   Post a comment
Agilent Technologies Inc. has formed a strategic partnership with Innowireless Co., Ltd. to enhance the development of LTE wireless test platforms.
Excerpt: Thermal Management Handbook
Design How-To  
5/3/2010   2 comments
This section of the handbook examines selection and use of temperature sensing components, including their selection, placement, and PCB layout guidelines

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