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Content tagged with Test & Measurement
posted in May 2013
STEM on Tektronix agenda
News & Analysis  
5/31/2013   5 comments
What is Tektronix doing to ensure the next-generation of experts in physics and electronics?
When is a multichannel power supply more convenient than a single-channel power supply?
Design How-To  
5/30/2013   Post a comment
Given that no equipment budget can afford every “bell and whistle,” it makes sense to ask which applications really need a multichannel power supply--and which ones don’t.
Higgs boson hunting with digitizers
Blog  
5/30/2013   7 comments
Sophisticated techniques like page-flip buffering enable analog-to-digital converters to offload data and re-arm at frequencies as high as 50 Mhz.
Slideshow: A look back at electronic test, part 1
Design How-To  
5/30/2013   Post a comment
The first segment surveys state-of-the-art test equipment for the period from 1988 to 2000.
Volkswagen to lead MCU energy benchmark group
Design How-To  
5/24/2013   Post a comment
Working group extended to establish energy efficiency benchmark for automotive microcontrollers. Volkswagen is to chair group with 11 chip companies contributing so far.
Optimizing power supply for test applications
Design How-To  
5/23/2013   1 comment
Although a review of a power supply’s specifications should always be a part of the selection process, other characteristics should also be considered.
Measuring the transition to disaster
Design How-To  
5/21/2013   2 comments
It is possible to see disaster coming. Certain warning signals indicate lack of stability even when a system appears calm.
Top 10 design articles on test and measurement
Blog  
5/21/2013   1 comment
In celebration of test (one of my favorite topics), take a look at top 10 design articles in the archives.
Artificial heart ready for human trial
Design How-To  
5/16/2013   1 comment
France’s Carmat SAS applied medical and aerospace technologies to develop a bioprosthetic artificial heart which has won approval for clinical trials.
Ground-bond instrument suits alternative-energy testing
Product News  
5/16/2013   Post a comment
Part of the HYAMP III series of manual ground-bond testers from Associated Research, the Model 3145 provides up to 40 A of DC ground-bond test current for alternative-energy and solar test applications.
Time-of-flight measurements open up user-interaction scenarios
Design How-To  
5/7/2013   1 comment
Engineers from STMicroelectronics explain that time-of-flight technology enables to measure the distance from the phone to a hand or other object, opening up new user-interaction scenarios that phone manufacturers and app developers can exploit.
Electronics in medicine: Insulin pump design
Design How-To  
5/6/2013   7 comments
Cypress Semiconductor describes the purpose of an insulin pump, its overall workings, and the requirements needed for its design and its implementation.


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As data rates begin to move beyond 25 Gbps channels, new problems arise. Getting to 50 Gbps channels might not be possible with the traditional NRZ (2-level) signaling. PAM4 lets data rates double with only a small increase in channel bandwidth by sending two bits per symbol. But, it brings new measurement and analysis problems. Signal integrity sage Ransom Stephens will explain how PAM4 differs from NRZ and what to expect in design, measurement, and signal analysis.

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