Orders from TI and others may boost Teradyne, but outlook is still cloudy News & Analysis 6/29/2001 Post a comment BOSTON -- Teradyne Inc.'s outlook remains cloudy in spite of a recent uptick orders for its automatic test equipment (ATE) from several established and new customers, reportedly including Texas Instruments Inc., according to analysts.
It's been a rough time for Teradyne and other ATE companies. The downturn in the ATE business caused Teradyne earlier this month to reduce its workforce and lower its forecast for the second quarter of 2001.
Schlumberger, IMS to set up a network of worldwide IC-testing centers News & Analysis 6/27/2001 Post a comment SAN JOSE -- The new alliance between Integrated Measurement Systems Inc. (IMS) and Schlumberger Semiconductor Solutions will create a new and low-cost outsourcing model for chip-testing, according to company officials.
Last week, the two companies announced plans to set up the first in a series of independent test centers that will provide IC debug, validation, characterization, probing, and related services for chip makers
Taiwan's ASE plans two IC-assembly plants in China News & Analysis 6/27/2001 Post a comment SANTA CLARA, Calif. -- Officials with Taiwanese IC-packaging and test giant Advanced Semiconductor Engineering Inc. (ASE) here outlined a bold strategy to enter the China market, telling SBN that the company plans to open two plants at two separate locations. The first facility is expected to be in production by early 2002.
Schlumberger rolls out new low-cost tester, reportedly ships first systems to Intel News & Analysis 6/25/2001 Post a comment SAN JOSE -- Schlumberger Semiconductor Solutions here today rolled out its new low-cost structural tester, while also announcing that it has shipped the system one month ahead of its original schedule.
One of the first customers for the Schlumberger DeFT line of automatic test equipment (ATE) is reportedly Intel Corp. Recently, Intel awarded Schlumberger a major contract to develop and ship a new, low-cost structural tester in order to combat the soaring costs of test (see
Advantest cuts flash testing costs by third in parallel system News & Analysis 6/21/2001 Post a comment SANTA CLARA, Calif. -- Advantest Corp. today rolled out a new front-end flash memory test system, which has the ability to test up to 128 devices simultaneously. The throughput of the T5771 tester is an eightfold increase compared to the company's previously available system, said Advantest.
Schlumberger to sell test business in pieces, but denies ATE customers are in limbo News & Analysis 6/20/2001 Post a comment SAN JOSE -- Schlumberger Ltd. here outlined its strategy to divest itself from the automatic test equipment (ATE) business, saying the operation will be sold in pieces rather than as a whole to potential buyers.
The company's ATE business, Schlumberger Semiconductor Solutions, also refuted claims that its customers are in limbo as a result of the divestiture. Its ATE customers include the who's who in the semiconductor business: Advanced Micro Devices, Intel, Motorola, among others.
Intel shifts test strategy to battle exploding costs of big ATE systems News & Analysis 6/19/2001 Post a comment SANTA CLARA, Calif. -- Intel Corp. has declared war on chip-testing costs, which have surged by 25 times for complex microprocessors and other ICs in recent years. To combat the staggering cost increase, Intel is revamping its entire testing strategy in an attempt to get more leverage from build-in self-test (BIST) and open up the use of lower cost testers.
Danaher acquires test-equipment maker Microtest for $74 million News & Analysis 6/13/2001 Post a comment WASHINGTON -- Danaher Corp. here today announced it has acquired Microtest Inc., a Phoenix-based supplier of test, measurement, and instrumentation equipment, for $74 million in stock.
Under the terms of the agreement, Microtest's network test and measurement operations will be combined with Danaher's Fluke Networks subsidiary.
Agilent Technologies to partner CETECOM News & Analysis 6/7/2001 Post a comment Agilent Technologies and Centro de Tecnologia de las Comunicaciones SA (CETECOM) have announced that CETECOM has integrated Agilent equipment into test solutions for certification of Bluetooth devices
Silicon Wave selects Agilent 93000 platform News & Analysis 6/7/2001 Post a comment Agilent Technologies and Silicon Wave have announced that the Agilent 93000 SOC Series with RF capabilities will be implemented for the development and manufacturing test of next-generation Bluetooth integrated circuits (ICs
Germany's SZ Testsysteme moves into Japanese market News & Analysis 6/4/2001 Post a comment TOKYO -- In a move to expand its presence in Japan and Asia, SZ Testsysteme AG of Germany today opened a new subsidiary in the Tokyo suburb of Chiba. Until now, the company had relied on distributors to sell its mixed-signal test equipment in Japan and the region.
Railtrack evaluates schoolboy's device News & Analysis 6/4/2001 Post a comment Railtrack is evaluating a design from a Young Electronic Designer Awards finalist who has invented a cheap rail safety device that could help prevent disasters like the Hatfield crash.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.