Speed development time and troubleshooting by capturing and analyzing video frames Design How-To 6/30/2006 Post a comment Video problems within the digital domain often appear to happen randomly and can be the most difficult to isolate and diagnose. Video monitoring and measurement equipment that can detect error conditions within the video signal are essential tools in dealing with these problems. Tektronix CaptureVu detects video errors and automatically captures the frame.
Protocol analyzer gets Wireless USB security support Product News 6/29/2006 Post a comment At the recent Certified Wireless USB Developers Conference, test-and-measurement vendor LeCroy Corp. demonstrated the benefits of its extensible UWBTracer protocol analyzer. The company's platform now supports multiple Certified Wireless USB Association and Security models.
16-bit PCI-bus plug-in lets your PC do high-speed signal analysis Product News 6/28/2006 Post a comment PC instrumentation house AlazarTech says it's got the world's fastest 16-bit PCI waveform digitizer. Designed for both OEM applications as well as lab use, the digitizer can be used for RF signal analysis, biomedical imaging, ultrasonics, radar, and more. The plug-in's two simultaneous analog inputs can each be sampled at rates up to 125-Msamples/s.
Wireless functional tester slashes cost-of-test Product News 6/28/2006 Post a comment Agilent Technologies now offers a mobile-phone functional tester that's priced starting at about $25,400. The tester includes a mobile test station and test software, as well as a special RF-shielded box with build-in antenna coupler.
Dual-channel logarithmic detector IC to measure and control RF signals Product News 6/27/2006 Post a comment Here's news of of an RFIC that works from 1-MHz out to 10-GHz, comprising a dual detector/controller. When it debuts in quantity later this year, the 6-stage demodulating chip will be able to be used to closely measure and control gain across a transmitter and receiver signal path, letting it serve in AGC circuits, power-level control circuits, and even to measure VSWR.
Data-acquisition board implements parallel realtime processing on your PC Product News 6/26/2006 Post a comment If your data-acq application needs realtime processing, yet you typically run engineering applications on a Windows PC, check out Microstar Laboratories's latest Data Acquisition Processor. The company's mid-range DAP plug-in provides concurrent processing, using an on-board Pentium, to achieve deterministic acquisition on a PC.
16-bit hybrid A/D modules address digital RF, imaging, ATE Product News 6/26/2006 Post a comment Slated primarily for RF systems, here are some low-distortion 100-Msample/s hybrid 16-bit A/D converter modules. These $80 hybrids can reduce non-linear distortion in pipelined data converters as designed into high-IF radio strips, where they offer an enhanced ENOB, bestowing higher data rates. They also lend themselves to scalability, letting you include more channels in a system.
Tektronix income jumps 48 percent News & Analysis 6/22/2006 Post a comment Test and measurement powerhouse Tektronix posted a 48 percent increase in year-to-year net income on an increase in revenue of 11 percent for its fiscal fourth quarter.
Scalable emulator checks RF paths for multi-path fading Product News 6/21/2006 Post a comment Every designer of an RF communications system knows that digitally modulated signals can be adversely affected by fading and multi-path propagation. Worse, mobile wireless environments are so diverse that they create combinations of these effects. The problem for receiver and transmitter designers, as well as system implementers, is how to characterize these effects to advantage. Here's a piece of test gear that can help.
Synthesized-instrument voltage module boosts boundary-scan Product News 6/20/2006 Post a comment If you implement IEEE-1149.x JTAG boundary-scan testability into your designs, you'll be interested in this synthesized-instrument. It's a 16-channel voltage measurement module with application-specific in-system re-configurable add-on resources. It can take bipolar voltage measurements on up to 16 different points on a DUT.
100-kHz realtime DSP systems shake out vibration Product News 6/19/2006 Post a comment Working with low-bandwidth sensors? Need a turnkey data-acq system that can be expanded to include as many channels as you need? Then take a look-see at these realtime DSP data-acq boards that are also available packaged, equipped with BNC connectors, and supported under Windows.
Cost-effectiveness marks PCIe protocol analyzer Product News 6/14/2006 Post a comment The folks at LeCroy continue to leverage the technology that originated at CATC, this time with a PCI Express protocol analyzer that supports x1/x2/x4 lane widths at 2.5-Gbyte/s speeds. Best of all, you can get your hands on one for less than $10K.
Automotive, ISM-band RF tester is scalable Product News 6/8/2006 Post a comment Are you involved with testing automobile airbag deployment electronics, perhaps climate-control sub-systems, or 42-V assemblies? If so, check out this functional tester from Agilent Technologies. It's a modular scalable system for testing automotive supplemental restraint systems, small body electronics, climate-control modules, and RF gear.
Finding MIMO: test vendors point the way Design How-To 6/8/2006 Post a comment Focus-On: MIMO is emerging as a foundation for next-generation WLAN products. With multiple Transmit and Receive antennas, MIMO devices promise high data rates and throughput, and greater range. But, for system developers, MIMO poses yet another test challenge. Click to learn what test vendors are doing about it.
Modules tailor multi-channel waveform measuring instrument Product News 6/5/2006 Post a comment A multi-channel digitizing oscilloscope bows in with the ability to house a variety of front-end signal conditioning modules. This instrument, replete with built-in hardcopy printer, will operate at a maximum sample rate of 10-Msamples/s, storing 50-Mwords in memory.
As we unveil EE Times’ 2015 Silicon 60 list, journalist & Silicon 60 researcher Peter Clarke hosts a conversation on startups in the electronics industry. Panelists Dan Armbrust (investment firm Silicon Catalyst), Andrew Kau (venture capital firm Walden International), and Stan Boland (successful serial entrepreneur, former CEO of Neul, Icera) join in the live debate.