Designing a MMIC VCO Design How-To 6/30/2008 Post a comment Looking for insights on the simulation and layout of a VCO? Then this article is for you! Click here to read about a methodology and design flow to design negative resistance type VCOs using standard MMIC components and Agilent-ADS software for simulation and layout generation.
Fluke : ScopeMeter suits CAN-bus troubleshooting Product News 6/30/2008 Post a comment As well as enabling detailed signal measurements, the rugged Fluke 125 Industrial ScopeMeter features a "bus health" mode function which gives a clear good/bad indication for the electrical signals on a CAN-bus and other buses.
Autodesk ends interest in bid for Flomerics News & Analysis 6/27/2008 Post a comment Autodesk will not pursue its interest in simulation software group Flomerics (Hampton Court, England) leaving the field clear again for Mentor Graphics, who has a 29 percent stake in the British company and who has made several bids to take control.
Safe bet: tire pressure sensors Teardown 6/26/2008 Post a comment One of Portelligent's analysts had the presence of mind to gather up the damaged tire pressure monitor (TPM) from his Toyota during a recent service center visit.
Group pushes LTE device interoperability testing News & Analysis 6/23/2008 Post a comment A global group of vendors and operators focused on LTE, the fast data rate next generation version of cellular technology, has outlined plans for cross-vendor device to network interoperability testing, setting the stage for global roaming on LTE networks.
Safer electrical testing Product News 6/23/2008 Post a comment The fast and safe testing of high voltages up to 5kV AC and 6kV DC is provided by the portable bench-top Sentinel HiPot/flash/dielectric tester now available from Clare Instruments
Latest RF/microwave products at MTT-S Product News 6/16/2008 Post a comment The IEEE MTT-S International Microwave Symposium 2008 (IMS2008) kicked off in Atlanta, Georgia this week featuring the latest developments in RF/microwave components. Check back for daily updates.
Temperature measurement on rotating parts Product News 6/11/2008 Post a comment By using the INPUD-T contactless transmission system from MESA Systemtechnik the disadvantages of mechanical or mercury slip rings for data transmission in temperature measurement systems in industrial processes can be avoided.
LabView poised for parallel role Product News 6/5/2008 Post a comment National Instruments is positioning its LabView graphical development environment as a multicore programming tool and plugging into parallel programming research efforts at Intel and Berkeley.
ATE signal generators target production environments Product News 6/3/2008 Post a comment Agilent Technologies has introduced the N5161A and N5162A MXG ATE analog and vector signal generators for the automated test equipment (ATE) environment. The company also announced several enhancements including higher power and improved distortion for the MXG RF signal generators.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.