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Content tagged with Test & Measurement
posted in June 2010
Book Excerpt Antennas: Fundamentals, Design, Measurement, Third Edition (Part 3 of 7)
Design How-To  
6/28/2010   Post a comment
Here are two chapters of a book on a vital topic, with emphasis on practical issues rather than equations
SPICE Simulation of Transmission Lines by the Telegrapher's Method (Part 1 of 3)
Design How-To  
6/28/2010   Post a comment
Understand the underlying principles and end up with a relatively simple sub-circuit which offers full frequency dependence and fidelity
Aeroflex rolls single-box multi-RAT tester
Product News  
6/24/2010   Post a comment
Aeroflex's 7100 tester now supports multiple Radio Access Technologies (RAT) including CDMA EV-DO and eHRPD as well as LTE to accelerate multi-mode cellular terminal device development for new LTE deployments.
Convert parallel impedances to series impedances
Design How-To  
6/21/2010   4 comments
Understand how impedance-topology conversion can simplify transformer equivalent circuits or filter networks
Source Measure Units tame challenges of assessing battery drain, power-supply functional test
Design How-To  
6/21/2010   Post a comment
Agilent N6781A and N6782A tackle non-trivial dynamic range and speed issues needed for today's products and test/measurement situations
Book Excerpt Antennas: Fundamentals, Design, Measurement, Third Edition (Part 2 of 7)
Design How-To  
6/21/2010   Post a comment
Here are two chapters of a book on a vital topic, with emphasis on practical issues rather than equations
Anritsu enhances one-box tester
Product News  
6/17/2010   Post a comment
The MT8820C from Anritsu now simulates an LTE enhanced node B to accurately and cost-efficiently measure LTE device parametrics during development and manufacturing.
Oscilloscope provides faster, more accurate high-speed digital design characterization
Product News  
6/17/2010   Post a comment
Agilent has expanded its digital communications analyzer portfolio with the introduction of the 86100D DCA-X wide-bandwidth oscilloscope that provides engineers with the tools needed to characterize their high-speed digital designs easily and accurately.
Debug will get your attention, sooner or later
Design How-To  
6/17/2010   Post a comment
Debug will get your attention one way or another. If you give it attention early in the development cycle, it will reduce the amount of time spent on debug later and in future designs as well as reducing the uncertainty related to debug.
FormFactor to cut 8% of workforce
News & Analysis  
6/16/2010   Post a comment
Wafer probe card maker FormFactor said Wednesday it will lay off about 8 percent of its workforce as part of an effort to reduce operating expenses. It marks the fifth time in a little more than two years that FormFactor has conducted a significant layoff.
Book Excerpt Antennas: Fundamentals, Design, Measurement, Third Edition (Part 1 of 7)
Design How-To  
6/14/2010   3 comments
Here are two chapters of a book on a vital topic, with emphasis on practical issues rather than equations
EDA DesignLine's "what's new" list at DAC!
Blog  
6/11/2010   1 comment
The countdown to the 47th Design Automation Conference (DAC) in Anaheim, Calif., has begun. Before you get to the Convention Center, have a look at EDA DesignLine's list of EDA products that will be introduced and showcased at the show.
SOFTWARE/HARDWARE TOOLS - Experts to be challenged to create logic analyzer in a day
News & Analysis  
6/4/2010   Post a comment
“Logic Analyzer in a Day” will showcase experts' talent with Opal Kelly FPGA modules and FrontPanel SDK. The Logic Analyzers will be available, FREE, on the Opal Kelly website.
Scope-based JTAG protocol application debuts
Product News  
6/3/2010   Post a comment
Agilent Technologies expanded its Infiniium oscilloscope application portfolio with a Joint Test Action Group (JTAG) protocol decode and triggering application.


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