Aeroflex rolls single-box multi-RAT tester Product News 6/24/2010 Post a comment Aeroflex's 7100 tester now supports multiple Radio Access Technologies (RAT) including CDMA EV-DO and eHRPD as well as LTE to accelerate multi-mode cellular terminal device development for new LTE deployments.
Anritsu enhances one-box tester Product News 6/17/2010 Post a comment The MT8820C from Anritsu now simulates an LTE enhanced node B to accurately and cost-efficiently measure LTE device parametrics during development and manufacturing.
Debug will get your attention, sooner or later Design How-To 6/17/2010 Post a comment Debug will get your attention one way or another. If you give it attention early in the development cycle, it will reduce the amount of time spent on debug later and in future designs as well as reducing the uncertainty related to debug.
FormFactor to cut 8% of workforce News & Analysis 6/16/2010 Post a comment Wafer probe card maker FormFactor said Wednesday it will lay off about 8 percent of its workforce as part of an effort to reduce operating expenses. It marks the fifth time in a little more than two years that FormFactor has conducted a significant layoff.
EDA DesignLine's "what's new" list at DAC! Blog 6/11/2010 1 comment The countdown to the 47th Design Automation Conference (DAC) in Anaheim, Calif., has begun. Before you get to the Convention Center, have a look at EDA DesignLine's list of EDA products that will be introduced and showcased at the show.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.