Circuit lets you test sample-and-hold amplifiers - measure voltage drop with a digital voltmeter Design How-To 6/29/2011 1 comment Sample-and-hold amplifiers sample an analog voltage and hold it until an ADC can digitize it. A perfect sampling circuit holds a voltage until digitizing is complete. Thus, the amplifier’s output is identical to its input. Real sample-and-hold amplifiers, however, can gain or lose voltage, producing an error. Offset voltages in amplifiers cause a static additive error. Further, there occurs a specific additive error, the so-called voltage pedestal, which originates within the transition from th
Hybrid test bed for real-time communication systems Design How-To 6/22/2011 Post a comment This paper describes an FPGA and Matlab-based hybrid solution dedicated for real-time communication tests. The main idea is to use an FPGA-based RT Ethernet device for simulation of communication errors. The next issue is Matlab-based software architecture for monitoring communication disturbances.
ECU architecture ensures failure safety Design How-To 6/17/2011 3 comments The complexity of automotive mechatronic systems makes it impossible to fully determine all potential failure modes or to test all possible behavior. The challenge is to architect control units in a way that dangerous failures are prevented or at least sufficiently controlled.
Oscilloscopes and ENOB Design How-To 6/15/2011 12 comments For scopes with bandwidth in the GHz range, one quality metric involves characterizing a scope’s analog-to-digital converter (ADC) using effective number of bits (ENOB). In a new design article added this week Joel Woodward and Brig Asay of Agilent Technologies explain that when selecting which scope to use, how important ENOB is and how effective ENOB is at predicting a scope’s measurement accuracy.
'Bit-Reshaper' corrects FlexRay timing errors Design How-To 6/10/2011 1 comment EMI susceptibility and signal quality issues with complex topologies have prevented a breakthrough of the FlexRay automotive data bus. But here's how to correct bit timing mismatches and significantly improve overall signal quality in FlexRay networks.
IJTAG standard holds promise for 3D chip test Design How-To 6/8/2011 1 comment IEEE P1687 Internal JTAG (IJTAG) standardizes the interface to validation and test instruments that are embedded in individual 3D chip dies, simplifying their use and deployment, and hastening the development of a marketplace for third-party tools and other related intellectual property.
Kozio adds support for Freescale's QorIQ P2 Product News 6/6/2011 Post a comment Kozio Inc. has expanded its in-system diagnostics solution to support Freescale Semiconductor's QorIQ P2 Platform Series, which includes the P2020 (dual-core) and P2010 (single-core) communications processors.
In conjunction with unveiling of EE Times’ Silicon 60 list, journalist & Silicon 60 researcher Peter Clarke hosts a conversation on startups in the electronics industry. One of Silicon Valley's great contributions to the world has been the demonstration of how the application of entrepreneurship and venture capital to electronics and semiconductor hardware can create wealth with developments in semiconductors, displays, design automation, MEMS and across the breadth of hardware developments. But in recent years concerns have been raised that traditional venture capital has turned its back on hardware-related startups in favor of software and Internet applications and services. Panelists from incubators join Peter Clarke in debate.