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Content tagged with Test & Measurement
posted in June 2013
MEMS accelerometer calculates static and dynamic signals
Product News  
6/27/2013   Post a comment
A sensor from Measurement Specialties uses gas-damped MEMs technology for high-g shock protection.
Tektronix to tap IBM 9HP SiGe process for next-gen oscilloscopes
News & Analysis  
6/27/2013   1 comment
Company to apply IBM technology for 70-gigahertz scopes due out as early as 2014.
Rohde & Schwarz Video platform tests ultra-HD consumer electronics
Product News  
6/27/2013   Post a comment
VTC and VTE video testers evaluate next-generation HDMI sink devices with 4k screen resolution and 4:2:0 pixel encoding.
PCI Express digitizer boasts onboard signal averaging
Product News  
6/27/2013   1 comment
Adlink’s PCIe-9852 digitizer board offers two simultaneously sampled 200-Msample/s input channels with 14-bit resolution, 90-MHz bandwidth, and up to 1 Gbyte of DDR3 memory.
Phase Matrix frequency synthesizer gets small
Product News  
6/27/2013   Post a comment
Compact unit leverages phase-refining technology to deliver low phase noise and fast frequency switching.
Product How To: Calculating power with a scope
Design How-To  
6/27/2013   Post a comment
Teledyne LeCroy’s Art Pini explains the math behind automatic power calculations on an oscilloscope equipped with power analysis software.
IEEE 1149.1 'JTAG' revision could save billions
News & Analysis  
6/20/2013   3 comments
Release cuts IC design cost through test reuse
Fluke handheld testers support cable certification
Product News  
6/20/2013   2 comments
Featuring interchangeable modules for copper, fiber and OTDR testing, Fluke Networks Versiv testers address system acceptance for copper and fiber jobs.
Agilent signal analyzer boasts expanded bandwidth and adds real-time capability
Product News  
6/20/2013   1 comment
In recognition of the needs of next-generation wireless networks, Agilent announced new options for its midrange N9020A MXA X-series signal analyzer.
Spectra2 XL3 handles LTE core testing
Product News  
6/20/2013   1 comment
New Tektronix Communications product tests IP multimedia subsystems (IMS) and evolved packet core (EPC) on a single platform.
Optimize testing safety-critical automotive parts
Design How-To  
6/19/2013   Post a comment
Advanced test technologies such as cell-aware ATPG and hybrid compression/LBIST provide key tools for ensuring compliance to standards like ISO 26262.
Comprehensive EMC simulation overcomes ECU validation challenges
Design How-To  
6/19/2013   Post a comment
Validating electromagnetic compatibility can be more straightforward by combining tools.
Rohde & Schwarz bench scopes boast logic analysis
Product News  
6/13/2013   8 comments
The R&S RTM series from Rohde & Schwarz offer 20 Msamples deep memory and a logic analysis option with 16 digital channels in a “lower end” scope.
TI 12-bit ADCs handle up to 900 Msamples/s
Product News  
6/13/2013   Post a comment
Comprising six single-channel and dual-channel models, Texas Instruments’ ADS5409 family of 12 bit ADCs offers sampling speeds ranging from 500 Msamples/s to 900 Msamples/s, while reducing board space requirements by 80%.
Slideshow: Looking back at electronic test, part 3
Design How-To  
6/13/2013   3 comments
Ever wonder what HP's first product looked like? How about Keithley's? Check out this slideshow of some old test equipment, back in the day when test equipment was more hardware than software...and sometimes took four hours to warm up!
Convert your smart phone into a signal generator
Design How-To  
6/13/2013   4 comments
Signal generators are handy, but rather than carry around another device, use the computing power and capabilities of a smart phone.
Measuring instantaneous RF power
Design How-To  
6/13/2013   Post a comment
Learn to measure instantaneous power on very long data records.
Leverage USB 3.0 for machine vision
Design How-To  
6/12/2013   9 comments
While USB 2.0, the most ubiquitous and versatile interface standard in the computing and consumer markets, also plays in the machine vision market, it falls short to other standards when it comes to bandwidth. This changes with USB 3.0.
May’s caption winner gave the cable guy a poke
6/12/2013   1 comment
A wry and Web-savvy caption won one lucky engineer recognition and admission into our honored EE wit-of-the-month club.
IMS 2013: 5 hurdles in high-speed and microwave
6/7/2013   Post a comment
From cross talk to power integrity--high-speed and microwave designers air shared challenges in IMS workshop.
I want to work in the Consumer Reports test lab
6/6/2013   3 comments
Take a look at some of the clever systems for staff has developed to evaluate everything from elliptical trainers to kitchen drawers.
Texas Instruments ADS5409 12-bit ADCs slash board space by 80 percent
Product News  
6/6/2013   Post a comment
TI’s family of 12-bit, 500- to 900-MSPS analog-to-digital converters reduces board space by 80 percent while providing industry-leading signal-to-noise ratio and spurious-free dynamic range.
Slideshow: Looking back at electronic test, part 2
Design How-To  
6/6/2013   Post a comment
The second segment highlights electronic test equipment from 1956 to 1987.
Get the most from your UI automated test suite
Design How-To  
6/6/2013   Post a comment
Careful planning and implementation around element locator strategies can yield incredible results for automation suites.
Portable spectrum analyzer sports GPS
Product News  
6/6/2013   1 comment
GPS capabilities allow handheld unit to help solve complex interference problems.
Peregrine Semiconductor PE42520 and PE42521 CMOS RF switches
Product News  
6/5/2013   Post a comment
Peregrine has set new standards of performance for high-frequency CMOS RF switches with the launch of its latest SPDT devices. Parts Search

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What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.

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