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posted in July 2001
MCT reviews operations after posting $2.5 million net loss in Q2
News & Analysis  
7/31/2001   Post a comment
ST. PAUL, Minn.--Micro Component Technology Inc. today reported a 20.6% sequential drop in net sales to $7.4 million in the second quarter from revenues in Q1, and a net loss of $2.5 million in the period ended June 30.
Singapore's STATS enters Taiwan with majority stake in test house
News & Analysis  
7/31/2001   Post a comment
SINGAPORE -- ST Assembly Test Services Ltd. today announced plans to acquire a 51% stake in Winstek Semiconductor Corp. of Taiwan, a semiconductor-testing house. The majority interest in the Hsinchu-based startup company will be purchased for $28 million in cash, said STATS.
Credence warns of 54-65% drop in sales in quarter
News & Analysis  
7/25/2001   Post a comment
FREMONT, Calif. -- Credence Systems Corp. today warned that revenues for the company's fiscal third quarter, ended June 30, will range from $15-to-$20 million, a 54-to-65% decline sequentially from the prior quarter and a 90-to-93% drop from the same period a year ago.
Tality's Bluetooth interoperability lab to test and debug designs
News & Analysis  
7/25/2001   Post a comment
Tality has established a Bluetooth interoperability and verification laboratory that will allow product developers to test and debug their designs.
Amkor cuts IC test costs with leadframe-strip testing in assembly plants
News & Analysis  
7/24/2001   Post a comment
CHANDLER, Ariz. -- Amkor Technology Inc. today outlined a new backend manufacturing strategy to integrate final chip assembly and testing steps by performing parallel tests on multiple ICs while they are still mounted on large leadframe strips.
Centring on services
News & Analysis  
7/24/2001   Post a comment
IFR is shifting its focus from the product to peripherals
Teradyne announces IP tester to lower the costs for ISPs and call centers
News & Analysis  
7/23/2001   Post a comment
BOSTON -- Teradyne Inc. here today announced a tester that is designed to reduce the costs for Internet Service Providers (ISPs) and broadband call centers. Teradyne's Broadband Test Division announced today the availability of NetFlare, a tester that determines a problem in an ISP network, backbone, or destination website. Based on trial results, Netflare reduces call handling times by up to 65% over current methods, according to Teradyne.
What's this? Applied is shopping for test business, say sources at Semicon West
News & Analysis  
7/23/2001   Post a comment
SAN JOSE -- The surprising buzz at the packaging and test-equipment portion of last week's Semicon West trade show did not revolve around flip-chip packaging, systems-on-a-chip testing, or other hot backend assembly technologies. Instead, rumors were flying around a possible new and surprising entry into the automatic test equipment (ATE) business--Applied Materials Inc.
3MTS and Ardext team up to drive down test cost for mixed-signal, SoC chips
News & Analysis  
7/20/2001   Post a comment
SAN JOSE -- At the Semicon trade show here, Third Millennium Test Solutions Inc. (3MTS) and Ardext Technologies Inc. teamed up to announce a new, low-cost test solution for analog ICs.
Keithley sales will likely fall again in current quarter, says CEO
News & Analysis  
7/19/2001   Post a comment
CLEVELAND -- Keithley Instruments Inc. here today reported net sales declined 10% in the company's fiscal third quarter, ended June 30, compared to revenues in the period last year. The supplier of test and measurement systems said it now expects sales decline sequentially in the current quarter due to the industry's sharp downturn.
Teradyne aims system at cutting test costs for nonvolatile memories
News & Analysis  
7/19/2001   Post a comment
SAN JOSE -- Teradyne Inc. moved to reduce the cost of test by rolling out a tester that supports a range of nonvolatile memories during the Semicon West trade show here this week.
Advantest plans R&D unit in Oregon for U.S. expansion
News & Analysis  
7/19/2001   Post a comment
SAN JOSE -- At the Semicon West show here, Advantest Corp. announced that it is establishing a new R&D and product development center for its electronic measuring instruments in Portland, Ore.
Keithley bundles RF and DC parametric testing for wafers with high-speed ICs
News & Analysis  
7/19/2001   Post a comment
Keithley Instruments Inc has announced availability of a single-insertion RF and DC parametric test solution for probing wafers of processed communications and high-speed digital devices
Keithley bundles RF and DC parametric testing for wafers with high-speed ICs
News & Analysis  
7/18/2001   Post a comment
SAN JOSE -- Keithley Instruments Inc. today announced availability of a single-insertion RF and DC parametric test solution for probing wafers of processed communications and high-speed digital devices.
Teradyne sales hit lowest level since '98 downturn, resulting in loss
News & Analysis  
7/18/2001   Post a comment
BOSTON--Teradyne Inc.'s sales in the second quarter fell to their lowest levels since the last industry downturn in 1998. The supplier of test equipment and interconnect systems late Tuesday evening reported Q2 sales of $365.8 million and a net loss of $20.5 million, or $0.12 per share, excluding special charges.
Electroglas wafer prober handles any size head for highly parallel tests
News & Analysis  
7/17/2001   Post a comment
SAN FRANCISCO--During the Semicon West trade show here today, Electroglas Inc. introduced a new wafer prober system that supports any size of test head and allows chip manufacturers to test multiple devices in parallel with simple interfaces to very large test heads.
Schlumberger sells first division in divestiture of ATE business
News & Analysis  
7/17/2001   Post a comment
SAN JOSE -- Schlumberger Ltd. has taken the first step in plans to divest its semiconductor test business by selling the assets of a division that makes IC thermal conditioning systems, pick-and-place handlers and other automated systems to Cohu Inc. for $14.2 million in cash.
BAE awards IFR with service contract
News & Analysis  
7/17/2001   Post a comment
IFR has been awarded a five-year agreement with BAE Systems for the supply of test equipment calibration and repair services
Agilent expands test offerings for flash memory, communications ICs
News & Analysis  
7/16/2001   Post a comment
PALO ALTO, Calif. -- Agilent Technologies Inc. here today moved lower the cost of test by announcing a pair of solutions for flash memory and communications chip applications.
Hynix moves closer to wafer-level test of fast DRAMs
News & Analysis  
7/13/2001   Post a comment
SEOUL -- Korea's Hynix Semiconductor Inc. has demonstrated the ability to perform high-speed wafer-level testing of DRAM devices using a probe system from Teradyne Inc. and probe cards from FormFactor Inc., the companies announced today.
FormFactor, Agilent say flash test system covers 25% of wafer in single probe
News & Analysis  
7/12/2001   Post a comment
LIVERMORE, Calif. -- FormFactor Inc. and Agilent Technologies Inc. today announced a high-volume flash-memory test solution that uses a high-density probe card to test chips in parallel across one-quarter of an entire 200-mm wafer.
Agilent reportedly beats Teradyne for ATE order at AMD
News & Analysis  
7/11/2001   Post a comment
PALO ALTO, Calif. -- In a major move to crack the x86-based microprocessor business, Agilent Technologies Inc. has reportedly beaten Teradyne Inc. for an automatic-test equipment (ATE) order at Advanced Micro Devices Inc. (AMD). Under the terms, AMD will purchase an undisclosed amount of Agilent's high-end VLSI logic testers. The systems will be used for wafer-sort testing applications for AMD's Athlon family of x86-based microprocessors, according to Agilent.
IMS says revenues fell 32% in Q2 from prior quarter
News & Analysis  
7/11/2001   Post a comment
BEAVERTON, Ore.--Integrated Measurement Systems Inc. (IMS) today said it fell short of its revenue targets for the second quarter, based on preliminary results. The supplier of engineering test systems said revenues were $12.5 million in Q2, compared to a previous forecast of $14-to-$16 million.
Germany's SZ Testsysteme continues expansion despite difficult downturn
News & Analysis  
7/11/2001   Post a comment
SAN JOSE -- While most of its competitors are reeling in the downturn, SZ Testsysteme AG of Germany believes it is bucking the worldwide recession in the automation test equipment (ATE) business.
DAC Revisited—Low Attendance, High Technology
Design How-To  
7/2/2001   Post a comment
This year's Design Automation Conference in Las Vegas had its share of exciting new products. TechOnLine's Content Director, Jim Lipman, has picked out and summarized some of the best products in key technology areas announced at or shortly prior to the show.


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