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Content tagged with Test & Measurement
posted in July 2005
USB TTL I/O module delivers higher drive
Product News  
7/29/2005   Post a comment
Here's news of a USB 2.0 TTL-compatible I/O module from Data Translation that can sink or source higher currents than its predecessors. It packs 28 I/O lines.
Realtime PXI instrument controllers run high-speed Intel processors
Product News  
7/28/2005   Post a comment
Two new PXI embedded controllers are slated for realtime instrumentation and data-acq tasks. One runs a 2-GHz intel Pentium M 760 processor. The second features a 1.5-GHz Celeron M 370 processor.
Fast parametric measurement-unit chips have small footprints
Product News  
7/27/2005   Post a comment
Expanding an existing line of standards-based per-pin parametric measurement unit ICs, chip maker Semtech is dishing up a family of three PPMU devices. They're claimed to have extremely fast settling times and the smallest form-factors for 40-mA devices. The use of BiCMOS also permits them to accommodate a 16.25-V range.
Ethernet board supports GigE Vision realtime imaging standard
Product News  
7/27/2005   Post a comment
An off-the-shelf OEM board can add GigE connectivity to industrial machine-vision and consumer cameras. The Pleora iPORT PT1000-VB In-Camera Engine lets you integrate high-performance GigE connectivity into almost any camera simply by changing out the back-end interface electronics. eeProductCenter Senior Tech Editor Alex Mendelsohn reports.
PC/104 board runs eight simultaneous A/D channels
Product News  
7/25/2005   Post a comment
Check out this less-than-$1000 analog/digital plug-in board. Operating at 100-ksample/s/channel rates, this PC/104 form-factor plug-in touts simultaneous channel sampling, a capability that's usually found only on more costly cards.
Pattern/pulse stimulus generator spans 150-MHz to 7-GHz
Product News  
7/25/2005   Post a comment
If you're adopting a leading-edge serial transmission technology such as Fiber Channel or PCI Express, or designing a microwave RF deck, characterizing your hardware at speeds between 4-GHz and 6-GHz can be a daunting task. That's where Agilent Technologies's new pulse-pattern generator comes in. It's a memory-based instrument that can be used from 150-MHz all the way up to 7-GHz.
Eight-port network analyzer operates from 300-kHz to 8-GHz
Product News  
7/25/2005   Post a comment
The ZVT8 from Rohde & Schwarz is claimed to be the world's first eight-port vector network analyzer up to 8 GHz for universal measurements on multiports and balanced DUTs.
Triple-play network test gear addresses voice, video, data
Product News  
7/21/2005   Post a comment
Here's news of four test-and-management approaches that address the convergence of voice, video, and data. These so-called triple-play tools are slated to assist service providers, network equipment manufacturers, and cable providers to ensure performance and reliability of next-generation networks.
Powerful final-test memory system debuts
Product News  
7/21/2005   Post a comment
Automatic test equipment maker Agilent Technologies now has a new final-test memory tester targeting multi-chip packages and discrete flash. Dubbed the Versatest Series Model V5500, this ATE system offers a tester-per-site architecture.
Ultra-wideband protocol analyzer decodes WiMedia & WUSB protocols
Product News  
7/20/2005   Post a comment
LeCroy's UWBTracer is claimed to be the industry’s first protocol analyzer that supports the new ultra wideband (UWB) WiMedia and Wireless USB (WUSB) standards.
Testers handle various A-GPS wireless location-based services
Product News  
7/19/2005   Post a comment
Instrumentation conglomerate Aeroflex is rolling out test capability to address the emerging development and conformance test requirements of Assisted-GPS. A-GPS is the heart of location-based services for cellphones. Aeroflex's systems are intended to test A-GPS systems in the lab.
Compact converters put logic on fiber
Product News  
7/19/2005   Post a comment
Test-and-measurement house Highland Technology now has both electrical-to-optical and optical-to-electrical converters that are compatible with the company's digital delay/pulse generator and other VME-packaged electrical/optical converter products. Use these to transmit error-free data over long distances using fiber.
40-MHz network analyzer uses USB-equipped PC
Product News  
7/18/2005   Post a comment
Here's a PC-hosted gain phase meter, vector network analyzer, impedance meter, and sinewave generator that can operate from 10-Hz to 40-MHz. It communicates with your PC using USB.
Agilent, Asylum Research team on nanotechnology
News & Analysis  
7/18/2005   Post a comment
Test and measurement company Agilent Technologies Inc. and Asylum Research have signed a joint development agreement to collaborate on technologies and applications in the area of nanotechnology measurements.
L’Inde ouvre un centre de test électronique
News & Analysis  
7/15/2005   Post a comment
L’Inde s’apprête à installer l’infrastructure nécessaire à la fabrication électronique.
India opens electronics test center
News & Analysis  
7/15/2005   Post a comment
India is moving to install the infrastructure needed for electronics manufacturing.
Agilent proposes test solution for MCPs
News & Analysis  
7/13/2005   Post a comment
Aimed at the problems posed by the skyrocketing use of multichip packages (MCPs), Agilent's system promises single-insertion, highly parallel full-speed testing of packaged MCPs.
STATS ChipPAC sees 2Q growth, analysts remain cautious
News & Analysis  
7/13/2005   Post a comment
Loss-making semiconductor test and packaging vendor STATS ChipPAC said it expects to report 13-percent sales growth for the quarter.
Keithley makes book on test techniques
Product News  
7/12/2005   Post a comment
Keithley Instruments' new 140-page handbook, "Overcoming the Measurement Challenges of Advanced Semiconductor Technologies: DC, Pulsed, and RF—From Modeling to Manufacturing" describes emerging measurement challenges for semiconductor manufacturers as they move into the 65 nm technology node and beyond.
LeCroy's digital scopes get faster, better
Product News  
7/6/2005   Post a comment
Oscilloscope maker LeCroy introduces three updated versions of its popular WavePro 7000 Series digital scopes. The latest 7000A instruments combine the analysis capability usually found in specialized high-end scopes with the flexibility and cost-effectivness of general purpose types. The 7000A come in three bandwidth models with top ends of 1-GHz, 2-GHz, and 3-GHz.
Yokogawa introduces Bit-Error-Rate Testers for 10-gigabit networks
Product News  
7/4/2005   Post a comment
Yokogawa has introduced two compact, easy-to-use and economical instruments for 10 Gbit/s bit-error-rate testing. The AQ2200-601 is based on the successful AQ2200 modular platform and is suited to both laboratory and manufacturing applications, while the AP9945 is a portable unit which is ideal for field testing.

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