Fast parametric measurement-unit chips have small footprints Product News 7/27/2005 Post a comment Expanding an existing line of standards-based per-pin parametric measurement unit ICs, chip maker Semtech is dishing up a family of three PPMU devices. They're claimed to have extremely fast settling times and the smallest form-factors for 40-mA devices. The use of BiCMOS also permits them to accommodate a 16.25-V range.
Ethernet board supports GigE Vision realtime imaging standard Product News 7/27/2005 Post a comment An off-the-shelf OEM board can add GigE connectivity to industrial machine-vision and consumer cameras. The Pleora iPORT PT1000-VB In-Camera Engine lets you integrate high-performance GigE connectivity into almost any camera simply by changing out the back-end interface electronics. eeProductCenter Senior Tech Editor Alex Mendelsohn reports.
PC/104 board runs eight simultaneous A/D channels Product News 7/25/2005 Post a comment Check out this less-than-$1000 analog/digital plug-in board. Operating at 100-ksample/s/channel rates, this PC/104 form-factor plug-in touts simultaneous channel sampling, a capability that's usually found only on more costly cards.
Pattern/pulse stimulus generator spans 150-MHz to 7-GHz Product News 7/25/2005 Post a comment If you're adopting a leading-edge serial transmission technology such as Fiber Channel or PCI Express, or designing a microwave RF deck, characterizing your hardware at speeds between 4-GHz and 6-GHz can be a daunting task. That's where Agilent Technologies's new pulse-pattern generator comes in. It's a memory-based instrument that can be used from 150-MHz all the way up to 7-GHz.
Triple-play network test gear addresses voice, video, data Product News 7/21/2005 Post a comment Here's news of four test-and-management approaches that address the convergence of voice, video, and data. These so-called triple-play tools are slated to assist service providers, network equipment manufacturers, and cable providers to ensure performance and reliability of next-generation networks.
Powerful final-test memory system debuts Product News 7/21/2005 Post a comment Automatic test equipment maker Agilent Technologies now has a new final-test memory tester targeting multi-chip packages and discrete flash. Dubbed the Versatest Series Model V5500, this ATE system offers a tester-per-site architecture.
Testers handle various A-GPS wireless location-based services Product News 7/19/2005 Post a comment Instrumentation conglomerate Aeroflex is rolling out test capability to address the emerging development and conformance test requirements of Assisted-GPS. A-GPS is the heart of location-based services for cellphones. Aeroflex's systems are intended to test A-GPS systems in the lab.
Compact converters put logic on fiber Product News 7/19/2005 Post a comment Test-and-measurement house Highland Technology now has both electrical-to-optical and optical-to-electrical converters that are compatible with the company's digital delay/pulse generator and other VME-packaged electrical/optical converter products. Use these to transmit error-free data over long distances using fiber.
Keithley makes book on test techniques Product News 7/12/2005 Post a comment Keithley Instruments' new 140-page handbook, "Overcoming the Measurement Challenges of Advanced Semiconductor Technologies: DC, Pulsed, and RF—From Modeling to Manufacturing" describes emerging measurement challenges for semiconductor manufacturers as they move into the 65 nm technology node and beyond.
LeCroy's digital scopes get faster, better Product News 7/6/2005 Post a comment Oscilloscope maker LeCroy introduces three updated versions of its popular WavePro 7000 Series digital scopes. The latest 7000A instruments combine the analysis capability usually found in specialized high-end scopes with the flexibility and cost-effectivness of general purpose types. The 7000A come in three bandwidth models with top ends of 1-GHz, 2-GHz, and 3-GHz.
Yokogawa introduces Bit-Error-Rate Testers for 10-gigabit networks Product News 7/4/2005 Post a comment Yokogawa has introduced two compact, easy-to-use and economical instruments for 10 Gbit/s bit-error-rate testing. The AQ2200-601 is based on the successful AQ2200 modular platform and is suited to both laboratory and manufacturing applications, while the AP9945 is a portable unit which is ideal for field testing.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.