JTAG/boundary-scan software supports Altera USB Blaster Product News 7/25/2006 Post a comment If you're embedding IEEE-1149.x JTAG boundary-scan testability into FPGAs, GoPEL has a software option for its existing software suite that supports Altera's popular USB-Blaster download cable. It lets the USB Blaster be used as a native JTAG/boundary-scan controller.
500-kHz PCI board comprises quiet high-resolution data-acq plug-in Product News 7/24/2006 Post a comment A PCI-bus Windows PC and one of Data Translation's DT3034 data acquisition boards will let you make 16-bit measurements on up to 32 single-ended or 16 differential channels with a sampling rate of 500-kHz. This board ensures an ENOB rating of more than 14 bits, along with 100-dB of spurious-free dynamic range.
Speedy JTAG controller is PCI Express-based Product News 7/17/2006 Post a comment A fast PCI Express-based JTAG controller provides boundary-scan testing using a Windows PC host. The system supports in-system programming and JTAG emulation for development, production, and field service, at sustained test clock frequencies up to 80-MHz.
Boundary-scan tool peels the lid on FPGAs, CPLDs Product News 7/17/2006 Post a comment Here's news of a USB 2.0 programming system that runs on a PC. It can handle JTAG boundary-scan and perform in-system programming of CPLDs and FPGAs, as well as other devices. Utilities let you program in minutes, rather than hours or days.
Switching matrix relays heft 60-W loads Product News 7/14/2006 Post a comment Could this be the world's highest density 1-A 2-pole relay switching matrix in a single-slot PXI module? Pickering Interfaces says so. Its latest module supports a matrix with up to 264 crosspoints, and can switch signals up to 150-V and 60-W.
$300 true-RMS DMM packs squarewave signal generator Product News 7/12/2006 Post a comment Instrument vendor B&K Precision's latest 51,000-count handheld DMM offers true-RMS operation as well as an unusual squarewave output function. This DMM also communicates using USB, and packs an array of other functions, such as temperature measurement and frequency/pulse counting.
Streaming data recorders save Terabytes Product News 7/12/2006 Post a comment As mass data collection assumes significance, it becomes critical to accurately capture, archive, and retrieve mass amounts of streamed data. Here's a family of single channel, dual channel, and quad channel Serial FPDP data recorders that can assist. Configurations can store Terabytes at rates up to 245-Mbytes/s/channel.
Color sensor board checks LEDs Product News 7/12/2006 Post a comment Need to test LEDs? Check out this board that integrates a true color-sensor chip, a trans-impedance amplifier, microcontroller with EEPROM, and a 10-bit A/D converter. It communicates using USB and runs PC software.
Multi-site high-resolution display tester is speedy Product News 7/12/2006 Post a comment By offering almost 8000 channels per test head, Agilent's latest TFT tester can test today's ultra-high-resolution panels, yet has the reserve to test even higher resolution screens in the future. Agilent's ATS-620 supports seventh- and eighth-generation glass fabrication lines and beyond, with multi-site test and defect detection.
USB module packs 15 independent counter/timers Product News 7/10/2006 Post a comment Event counting, frequency measurement, pulse counting, PWM, position measurement, and pulse generation are just a few sub-system elements that can be implemented with a timer/counter circuit. If you need functions like these, check out this USB plug-and-play module.
CAT-certified PXI module switches high-voltage Product News 7/5/2006 Post a comment Take a look at this high-voltage PXI switch module. It's capable of routing signals up to 600-V, and uses an innovative interleaved topology for making differential measurements on eleven channels of a battery stack, with just two 6 x 1 1-wire multiplexers.
Standard-compliant EMC tests at maximum measurement speed News & Analysis 7/5/2006 Post a comment ESU from Rohde & Schwarz is a family of CISPR16-1-1-compliant EMI test receivers that meet all civil and military standards for electromagnetic interference measurements. New FFT-based test methods speed up the measurement. With the time-domain scan, users can perform overview measurements up to 100 faster than on previous EMI test receivers.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.