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Content tagged with Test & Measurement
posted in July 2006
Platform provides RF hardware measurement for wireless networking
Product News  
7/31/2006   Post a comment
Agilent Technologies announces Connected Solutions Workbench for testing wireless systems.
Agilent makes full 3D EM simulation accessible at a lower price
Product News  
7/28/2006   Post a comment
EMDS lets designers analyze and visualize EM effects to fine tune the performance of high-frequency RF circuit designs.
JTAG/boundary-scan software supports Altera USB Blaster
Product News  
7/25/2006   Post a comment
If you're embedding IEEE-1149.x JTAG boundary-scan testability into FPGAs, GoPEL has a software option for its existing software suite that supports Altera's popular USB-Blaster download cable. It lets the USB Blaster be used as a native JTAG/boundary-scan controller.
500-kHz PCI board comprises quiet high-resolution data-acq plug-in
Product News  
7/24/2006   Post a comment
A PCI-bus Windows PC and one of Data Translation's DT3034 data acquisition boards will let you make 16-bit measurements on up to 32 single-ended or 16 differential channels with a sampling rate of 500-kHz. This board ensures an ENOB rating of more than 14 bits, along with 100-dB of spurious-free dynamic range.
Efficient testing ensures requirements traceability and verification: Part 1
Design How-To  
7/21/2006   Post a comment
Requirements-based testing integrates requirements with automotive electronics hardware and software testing to streamline development and cut costs.
Flash-capacitor IC powers portable UV flame detector
Design How-To  
7/21/2006   Post a comment
A high-voltage power supply that can quickly charge a capacitor to 325 volts for a UV flame detector, and be powered by a battery, is difficult to design. Use a flash-capacitor circuit to provide the high voltage needed.
Data-acq software lets you interactively design filters
Product News  
7/19/2006   Post a comment
You can now design bandpass filters that roll off at better than 96-dB/quarter-octave. The latest version of DAPstudio measurement software from Microstar Labs lets you do this, building and running applications based on the company's hardware.
Configurable data-acq box provides gobs of analog and digital I/O
Product News  
7/19/2006   Post a comment
Sealevel Systems is expanding its family of modular I/O boxes. Its latest system provides 16 single-ended, or eight differential, 12-bit analog inputs. It also provides two 12-bit DAC outputs, as well as eight optically-isolated digital inputs, and eight open-collector digital outputs.
Speedy JTAG controller is PCI Express-based
Product News  
7/17/2006   Post a comment
A fast PCI Express-based JTAG controller provides boundary-scan testing using a Windows PC host. The system supports in-system programming and JTAG emulation for development, production, and field service, at sustained test clock frequencies up to 80-MHz.
Boundary-scan tool peels the lid on FPGAs, CPLDs
Product News  
7/17/2006   Post a comment
Here's news of a USB 2.0 programming system that runs on a PC. It can handle JTAG boundary-scan and perform in-system programming of CPLDs and FPGAs, as well as other devices. Utilities let you program in minutes, rather than hours or days.
Switching matrix relays heft 60-W loads
Product News  
7/14/2006   Post a comment
Could this be the world's highest density 1-A 2-pole relay switching matrix in a single-slot PXI module? Pickering Interfaces says so. Its latest module supports a matrix with up to 264 crosspoints, and can switch signals up to 150-V and 60-W.
Delay generator is programmable for delay, width, and polarity
Product News  
7/13/2006   Post a comment
If you're dealing with sequential event triggering tasks, here's a board-level or box-packaged digital delay generator that should fill the bill for a ready-to-go multi-channel precision delay block.
Encounter Test adds compression, diagnostic capabilities
News & Analysis  
7/12/2006   Post a comment
Market-leading EDA vendor Cadence Design Systems announced a new release of the company's Encounter Test product with the addition of new compression and yield diagnostics capabilities.
$300 true-RMS DMM packs squarewave signal generator
Product News  
7/12/2006   Post a comment
Instrument vendor B&K Precision's latest 51,000-count handheld DMM offers true-RMS operation as well as an unusual squarewave output function. This DMM also communicates using USB, and packs an array of other functions, such as temperature measurement and frequency/pulse counting.
Streaming data recorders save Terabytes
Product News  
7/12/2006   Post a comment
As mass data collection assumes significance, it becomes critical to accurately capture, archive, and retrieve mass amounts of streamed data. Here's a family of single channel, dual channel, and quad channel Serial FPDP data recorders that can assist. Configurations can store Terabytes at rates up to 245-Mbytes/s/channel.
Color sensor board checks LEDs
Product News  
7/12/2006   Post a comment
Need to test LEDs? Check out this board that integrates a true color-sensor chip, a trans-impedance amplifier, microcontroller with EEPROM, and a 10-bit A/D converter. It communicates using USB and runs PC software.
Multi-site high-resolution display tester is speedy
Product News  
7/12/2006   Post a comment
By offering almost 8000 channels per test head, Agilent's latest TFT tester can test today's ultra-high-resolution panels, yet has the reserve to test even higher resolution screens in the future. Agilent's ATS-620 supports seventh- and eighth-generation glass fabrication lines and beyond, with multi-site test and defect detection.
Massively parallel flash tester handles 720 devices
Product News  
7/11/2006   Post a comment
Look at this highly parallel flash tester, capable of testing 720 devices at one time. That's more than double the configuration of predecessors.
USB module packs 15 independent counter/timers
Product News  
7/10/2006   Post a comment
Event counting, frequency measurement, pulse counting, PWM, position measurement, and pulse generation are just a few sub-system elements that can be implemented with a timer/counter circuit. If you need functions like these, check out this USB plug-and-play module.
Lack of testers hinders China 3G standard
News & Analysis  
7/7/2006   Post a comment
A lack of test equipment remains a key hurdle to commercialization of China's 3G standard, a mobile phone test equipment supplier said.
Vector signal analysis software gets 802.11n MIMO modulation capability
Product News  
7/6/2006   Post a comment
Agilent Technologies announces the availability of IEEE-802.11n MIMO modulation analysis capability for the company's existing vector signal analysis software and instrumentation.
CAT-certified PXI module switches high-voltage
Product News  
7/5/2006   Post a comment
Take a look at this high-voltage PXI switch module. It's capable of routing signals up to 600-V, and uses an innovative interleaved topology for making differential measurements on eleven channels of a battery stack, with just two 6 x 1 1-wire multiplexers.
Free Native .NET class library rolls for test software
Product News  
7/5/2006   Post a comment
If you're a user of Data Translation Inc. USB or PCI hardware, come and get your free copy of a native .NET class library. It's for developing test-and-measurement applications in Microsoft Visual Studio.
Standard-compliant EMC tests at maximum measurement speed
News & Analysis  
7/5/2006   Post a comment
ESU from Rohde & Schwarz is a family of CISPR16-1-1-compliant EMI test receivers that meet all civil and military standards for electromagnetic interference measurements. New FFT-based test methods speed up the measurement. With the time-domain scan, users can perform overview measurements up to 100 faster than on previous EMI test receivers.

As data rates begin to move beyond 25 Gbps channels, new problems arise. Getting to 50 Gbps channels might not be possible with the traditional NRZ (2-level) signaling. PAM4 lets data rates double with only a small increase in channel bandwidth by sending two bits per symbol. But, it brings new measurement and analysis problems. Signal integrity sage Ransom Stephens will explain how PAM4 differs from NRZ and what to expect in design, measurement, and signal analysis.

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