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Content tagged with Test & Measurement
posted in July 2007
Noise modules provide wide bandwidth frequencies to test filters, RF systems
Product News  
7/31/2007   Post a comment
Wireless Telecom Group is offering a pair of noise modules for the computing and military equipment markets that deliver the wide bandwidth frequencies required to test filters, electronic circuits or RF systems.
Custom module eases boundary-scan integration with Teradyne ICT
Product News  
7/31/2007   Post a comment
JTAG Technologies has released the JT 2147 Custom Function Module (CFM) for use with its Symphony 228xPLUS integration package for Teradyne's TestStation in-circuit testers.
Unit measures voltage, current in electronic components
Product News  
7/31/2007   Post a comment
Yokogawa Electric has developed the GS820, a multi-channel source measure unit that measures voltage, current and other characteristics of semiconductors and electronic components.
Pickering rolls out PXI RF switching modules
Product News  
7/31/2007   Post a comment
Pickering Interfaces has introduced high-density RF modules that provide switching characteristics to 3-GHz.
Voltage/current measurement instrument targets automotive and power management
Product News  
7/26/2007   Post a comment
Teradyne's DC90XP, a high-power voltage/current source and measurement instrument for FLEX and microFLEX test systems, targets automotive and power management markets.
Tektronix tools aid in China's DTV push
News & Analysis  
7/26/2007   Post a comment
Tektronix and China Electronics Standardization Institution have created a joint laboratory for advanced research and assessment of digital RF and digital TV standards in China.
Time instrument delivers 25 million events-per-second throughput rate
Product News  
7/25/2007   Post a comment
Agilent's TC890 time-to-digital converter features six independent stopwatches for precise timing measurements from a common start event to multiple stop events at a high resolution.
Understanding RF Instrument Specifications Part 1
Design How-To  
7/25/2007   Post a comment
This is the first of a three-part article series on RF instrument fundamentals from National Instruments. This article covers real time (instantaneous) bandwidth, frequency range, tuning speed, phase noise, and VSWR.
Software package simplifies digital RF test signal creation
Product News  
7/24/2007   Post a comment
Tektronix has announced the availability of RFXpress, an advanced software package that performs RF/IF/IQ waveform creation and editing of digitally modulated signals for its AWG5000 and AWG7000 arbitrary waveform generators.
Memory tester debuts for small lot production
Product News  
7/23/2007   Post a comment
Verigy's latest product delivers high-mix, low-volume, low-cost production in small footprint.
Parametric test systems migrate to Linux OS
Product News  
7/19/2007   Post a comment
Keithley Instruments has announced several enhancements to its S600 Series Parametric Test Systems including a migration to the Linux OS.
When Intel speaks, do chip test execs listen?
News & Analysis  
7/19/2007   Post a comment
Intel Corp.'s director of test operations threw down the gauntlet at a panel of automated test equipment executives at the Semicon West Test Summit.
Graphical software available for LXI test instruments
Product News  
7/19/2007   Post a comment
Data Translation says it has released the first drag and drop graphical software for LXI test and measurement applications.
Portable protocol analyzer supports 3.0 Gbits/s data rates
Product News  
7/19/2007   Post a comment
Catalyst Enterprises has expanded its line of Serial ATA (SATA) and Serial Attached SCSI (SAS) protocol analyzers with the introduction of the low-cost portable STX-131.
Pickering expands LXI-compliant switch line
Product News  
7/18/2007   Post a comment
Pickering Interfaces is expanding its LXI-compliant switching product line with the introduction of the 60-310 high-voltage matrix and the 60-510 LXI low thermal EMF matrix.
Hardware in the loop fault simulation modules debut
Product News  
7/18/2007   Post a comment
Pickering Interfaces is expanding its PXI switching product line designed for hardware-in-the-loop fault simulation applications with three modules—the 40-190, 40-195 and 40-196.
Noise Com introduces J7000 series jitter test systems
Product News  
7/18/2007   Post a comment
The NoiseCom J7000 Jitter Test System is a designed to be a powerful test instrument to alter serial signal streams through injection of Gaussian noise in a way that reflects real-world signal behavior.
Tradeoffs and the Evolution of the Digital Oscilloscope
Design How-To  
7/18/2007   Post a comment
Agilent Technologies Phil Stearns explains how to avoid the last remaining pitfalls of digital scope technology.
IC test system handles high-speed serial buses
Product News  
7/17/2007   Post a comment
Credence Systems claims the enhanced Sapphire D-6432DFT instrument is the first integrated semiconductor test system with far-end loopback implementation for high-speed serial buses.
Advantest, Wavecrest co-develop jitter analysis test tool
Product News  
7/16/2007   Post a comment
Advantest and Wavecrest have launched a jointly developed jitter analysis software tool (JAT) for Advantest's multi-lane 6.5 Gbits/s high-speed interface SerDes test solution.
Handheld XRF analyzers achieve improved detection limits
Product News  
7/16/2007   Post a comment
Thermo Fisher Scientific Inc. has launched a new platform of handheld X-ray fluorescence (XRF) analyzers with improved detection limits and shorter measurement times.
Electromagnetic field simulator features power rail extraction
Product News  
7/13/2007   Post a comment
Ansoft enhances its SIwave full-wave electromagnetic field simulator with new features for power rail extraction in low-voltage/high-current PCB and IC package designs.
What's hot at Semicon West?
News & Analysis  
7/12/2007   Post a comment
A slew of companies are showing products at Semicon West.
Agilent, GCT partner on WiMAX manufacturing test system
Product News  
7/12/2007   Post a comment
Agilent Technologies and GCT Semiconductor have announced plans to jointly implement a WiMAX manufacturing test system for GCT's WiMAX chipsets.
Test software supports HDMI compliance test spec
Product News  
7/11/2007   Post a comment
The TDSHT3 test software from Tektronix, Inc. has been upgraded to support the HDMI compliance test specification version 1.3b.
Testing beyond the specs: Why test higher in frequency and field strength?
Design How-To  
7/10/2007   Post a comment
The alternative of just testing to the required specifications may provide an initial cost savings, but in the long run can prove disastrous if your customer discovers problems with one of your products that just "squeaked" through a minimal EMC testing protocol.
Hardware-in-the-loop solution based on Xilinx FPGAs and Intel Processors
Product News  
7/10/2007   Post a comment
Opal-RT announces eMEGAsim, a real-time, hardware-in-the-loop solution for the simulation of power and energy distribution systems.
Wi-Fi channel emulation goes mainstream
Design How-To  
7/9/2007   Post a comment
Channel emulation will be a key element in all future WLAN test and performance-evaluation equipment.
Sampling oscilloscope addresses next-generation serial data standards
Product News  
7/9/2007   Post a comment
LeCroy's WaveExpert 100H sampling oscilloscope supports next-generation serial data standards including PCI Express, serial ATA, XAUI and 10 Gigabit Ethernet.
Compact power meter complies with LXI Class standard
Product News  
7/6/2007   Post a comment
Agilent Technologies Inc. has developed what it claims is the world's first LXI-compliant power meter.
USB-based sensors provide simpler power measurements
Product News  
7/3/2007   Post a comment
Agilent has released the Agilent U2000 series of USB-based power sensors, which the company says are more affordable and lighter weight than typical power meters and similar power-sensing solutions.
Understand noise power ratio for modern wireless applications
Design How-To  
7/2/2007   Post a comment
Originally used to check 4-kHz wide voice channels in FDM links, noise power ratio is useful today in characterizing multi-channel wideband communication systems, but there are some important differences in the modern measurement techniques.
ESL rolls out fiber-to-RS485/422/232 interface converter
Product News  
7/2/2007   Post a comment
Aimed at defense applications, Electro Standards Laboratories' (ESL) Model 4149 high speed ruggedized fiber-to-RS485/422/232 interface converter provides typical operating speeds of 1.5-Mbits/s for RS232 to fiber conversion and 20-Mbits/s for RS485/422 to copper conversion.
Software upgrade adds USB connectivity, Vista support to audio analyzers
Product News  
7/2/2007   Post a comment
Audio Precision Inc. has made key enhancements to its AP2700 v3.30 and ATS v1.60 control software, adding USB connectivity, native support for Windows Vista, and improved user profile management to its 2700 Series and ATS-2 audio analyzers.


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