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Content tagged with Test & Measurement
posted in July 2011
Composite supersets tame wiring harness engineering complexity
Design How-To  
7/28/2011   Post a comment
With many electrical options and physical variants in today's cars, potential configurations for a single platform may number in the millions. Thus the electrical distribution system harness is at the heart of the automotive complexity challenge.
Portable COTS test interface brings lab capabilities to the field
Product News  
7/27/2011   Post a comment
Field-portable test and simulation unit gives users a comprehensive menu of interface options.
Measure propagation delays using time-domain reflectometry
Design How-To  
7/27/2011   Post a comment
TDR beats active probes for high-speed delay measurements.
Spread-spectrum clocking reduces EMI in embedded systems
Design How-To  
7/27/2011   3 comments
PCI Express technology incorporates the use of spread-spectrum clocking to reduce EMI.
USB data acquisition module for audio and acoustic testing
Product News  
7/27/2011   Post a comment
Data Translation released the DT9837C data acquisition module, featuring four 24-bit A/D inputs and specifically designed for audio testing and acoustic measurement applications.
Integrated radar front end trims system cost and size
Design How-To  
7/26/2011   5 comments
Integrated automotive chip allows multiple applications in an efficient package—while on-chip signal conditioning and data capture let design engineers program settings for different driving conditions.
Flow batteries: EVs fuel up on electrons at the 'gas pump'
Design How-To  
7/25/2011   9 comments
Batteries with replaceable fluids may improve electric vehicle energy density.
Modena v 5.1.0 facilitates specification and testing of infotainment ECUs
Product News  
7/23/2011   Post a comment
Automotive engineering company Berner & Mattner presents Modena 5.1.0 as an extended version of its specification and test software for model-based development in automotive infotainment, thus increasing the application range for users.
A Volt for a week
Blog  
7/22/2011   16 comments
I have a Chevy Volt to drive for a week. If you have any questions on the car or its operation, post them here and I'll try and answer them.
Op amp overcomes precision/protection tradeoff dilemma
Product News  
7/20/2011   Post a comment
ADA4096-2 from Analog Devices offers typical 35 uV offset, with +/-30V OVP
the fall guy
Blog  
7/19/2011   3 comments
Martin participates in a prank and then takes the fall when the victim is...annoyed. Is this fair?
Scalable SoC drives 'hybrid' cluster displays
Design How-To  
7/19/2011   Post a comment
Between mechanical automotive instrument clusters and the growing number of free programmable clusters there are hybrid dashboards, which combine traditional meters and at least one graphical display.
Essential principles for practical analog BIST
Design How-To  
7/19/2011   Post a comment
Practical analog BIST has the potential to reduce IC-test costs and time to market.
Managing signal integrity in tomorrow's high-speed flash-memory-system designs
Design How-To  
7/19/2011   Post a comment
Next-generation flash-memory technology will tout data-transfer rates as much as 10 times faster than currently available. However, increasing distortions in the data-carrying digital signals can cause data-transfer failures, complicating the management of signal integrity. Proper design strategies can help you deliver reliable, high-performance products.
Freedom of choice in platforms
Blog  
7/19/2011   Post a comment
This year has seen three test platforms continuing to develop their market message and attract new users from older platforms such as GPIB and VXI, the choices seem to continue to expand for users.
Anritsu multi-mode signaling tester supports 2G to 4G-LTE
Product News  
7/18/2011   Post a comment
Anritsu Company introduced the MD8475A signaling tester that offers the capability to test applications and operating systems on the latest high-speed, multi-mode LTE devices.
Top 5 in RF Design
Design How-To  
7/18/2011   Post a comment
If you missed any of these, now might be a good time to check them out.
Aeroflex announces automated test equipment for RF and mixed signal ICs
Product News  
7/18/2011   Post a comment
Available as turnkey systems or configurable subsystem modules, the AX-Series is based on industry standard AXIe and PXI modules.
Simulation techniques test automotive cluster display ECUs
Design How-To  
7/14/2011   Post a comment
With the automotive display cluster being the main means to convey vehicle status and information, it is of utmost importance to ensure reliable functional testing for cluster devices.
Minimizing cable-induced measurement errors in high current applications
Blog  
7/13/2011   Post a comment
In my job as an applications engineer, I’ve been fielding lots of calls about test and measurement problems that engineers encounter with high current applications like characterizing high power LED modules and high brightness light-emitting diodes (HBLEDs). At higher test currents, the appropriate cabling techniques are particularly important in obtaining repeatable and accurate measurements and maximizing performance.
Is your probing setup good enough to measure DDR3 signal integrity?
Design How-To  
7/13/2011   5 comments
DDD3 memory interface speeds have been going up steadily and are now approaching 2000 Mbps data rates. DDR4 is also nearly round the corner [6]. At these high data rates, it is becoming increasingly difficult to get good probing solutions which allow performing Signal Integrity characterization. High speed characterization is considered important for silicon based product development cycle. It is needed to understand the limitations of the current generation of DDR interface designs and to gear
Advantest announces NAND flash test solutions
Product News  
7/11/2011   Post a comment
Advantest Corporation announced the availability of two new solutions for next-generation NAND flash memory test: the T5773 for package test and the HA5100CELL, based on the Harmonic architecture, for wafer test.
PXI/MOST interface ensures end-of-line test quality
Design How-To  
7/8/2011   Post a comment
Detailed compliance testing eliminates faults and ensures performance of different MOST interfaces in the same network.
Wireless automotive audio uses minimum power, bandwidth
Design How-To  
7/8/2011   Post a comment
ISM-band technology offers EMI immunity while providing lossless audio.
Engineering a DIY EV!
Design How-To  
7/8/2011   7 comments
Ever think about building your own electric car? Well, here's one engineer who did!
Understanding the impact of digitizer noise on oscilloscope measurements
Design How-To  
7/6/2011   1 comment
Whether you are designing or buying a digitizing system, you need some means of determining real-life performance. How closely does the output of any ADC, waveform digitizer, or DSO follow an analog input signal? ENOB testing provides a means of establishing a figure of merit for dynamic digitizing performance.
Tektronix buys validation tool vendor
News & Analysis  
7/5/2011   3 comments
Test and measurement vendor Tektronix announced the acquisition of ASIC/FPGA prototyping debug software provider Veridae Systems. Terms of the acquisition were not disclosed.
The platform alternative: Testing miniaturized and highly integrated components
Design How-To  
7/3/2011   Post a comment
Platform testing medical devices in the manufacturing stage could help firms manage costs, access, and coverage in electronics


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