NI launches next-gen multi-function data-acq plug-ins Product News 8/31/2004 Post a comment Offering no less than 20 new products, all introduced in a family at the same time, National Instruments is rolling out what it bills as the next generation of multi-function DAQ products. Significantly, they use the company's newly designed NI-STC 2 system controller chip and a new NI-PGIA 2 monolithic amplifier chip.
New Innovations Simplify Logic Analysis News & Analysis 8/27/2004 Post a comment Logic analyzers are instruments that have a reputation for being difficult to learn and use. They earned this reputation because they are unusually complex and require users to understand how they were designed in order to understand how to use them. Recent research on the logic analyzer usage model has simplified logic analyzers by streamlining the tasks that users perform. Agilent Technologies' Doug Beck reviews the new innovations in logic analyzer design, using the Agilent 16900 logic analys
Embedded LabVIEW plays on new industrial platform Product News 8/23/2004 Post a comment Data-acq and test-and-measurement giant National Instruments is playing hardball at the innovation game again. Debuting what the company says are ultra high-performance embedded control and acquisition platforms, they're designed for applications where small physical size and high reliability are important. NI's new RIO technology gives LabVIEW developers the ability to define custom measurement hardware and circuitry using FPGAs and LabVIEW's popular graphical development tool.
GNU remote protocol debugging tool debuts Product News 8/23/2004 Post a comment Macraigor Systems has a new API and a GNU Debugger remote protocol supporting instant plug-and-play. The company's latest tool uses a 74-MHz 32-bit embedded processor that supports debug of multiple CPUs on a single scan chain.
High-capacity data-acq modules are ruggedized plug-ins Product News 8/20/2004 Post a comment Working with MIL or ruggedized data acquisition? Then check out Heim Data Systems's new compact high channel-capacity modules. These modules handle video and PCM signals, as well as avionics bus data, interfacing with instrumentation and flight test recorders that can handle a variety of sensors. The modules are available for operation in systems producing both Heim DATaRec-3 and IRIG-106 Chapter 10 data formats.
API puts JTAG test into LabVIEW, TestStand, others Product News 8/19/2004 Post a comment Here's news of a suite of virtual instruments and a DLL interface that serves as boundary-scan infrastructure for test executives. With no prior knowledge of IEEE-1149.1/JTAG test, this boundary-scan test application environment can be integrated into custom test executives developed with popular tools such as National Instruments' LabView and TestStand.
Focus-On: Jitter's the critter to fritter Product News 8/18/2004 Post a comment If you're designing a high-speed communications link, it's likely you're grappling with characterizing your system at-speed. Jitter looms as the biggest problem, but test-and-measurement makers are responding with cost-effective, accurate, and highly repeatable instruments. eeProductCenter Senior Technical Editor Alex Mendelsohn reviews some recent significant product developments that can help you tackle jitter.
I/O libraries accelerate test system connections across Ethernet, USB connections Product News 8/17/2004 Post a comment Do you sometimes get stymied configuring and connecting PC-hosted and PC-controlled test gear? With a multi-vendor automation tool that claims to enable error-free test-system connections in under 15 minutes, Agilent Technologies may be of help. Its latest test software packs updated I/O libraries and automated connection tools that detect instruments connected to a PC. It also configures their interfaces, and verifies proper connections---even in test systems that mix Ethernet/LAN, IEEE-
Agilent's latest test toolkit outperforms off-the-shelf software Product News 8/17/2004 Post a comment Agilent Technologies has a new spin of its T&M Toolkit v2.0 with Test Automation. It will let you mix and match instruments, interfaces, languages, and components in ways you probably haven't experienced. Agilent claims its newest software provides the industry's fastest method of sequencing measurements and analyzing results.
Agilent sees growth slowing after strong quarter News & Analysis 8/16/2004 Post a comment Agilent Technologies Inc. reported net earnings of $100 million on sales of $1.89 billion in the fiscal third quarter ended July 31, compared to a net loss of $1.56 billion on sales of $1.89 billion in the year-ago fiscal third quarter.
Agilent sees growth slowing after strong quarter News & Analysis 8/12/2004 Post a comment Agilent Technologies Inc. reported net earnings of $100 million on sales of $1.89 billion in the fiscal third quarter ended July 31, compared to a net loss of $1.56 billion on sales of $1.89 billion in the year-ago fiscal third quarter.
Finisar kauft Netzanalyse-Spezialunternehmen News & Analysis 8/11/2004 Post a comment Nach der Übernahme von Infineons Glasfasersparte bleibt der Netzausrüster Finisar weiter auf Einkaufstour. Jetzt hat das Unternehmen die Data Transit Corp. gekauft, einen Hersteller von Netzprotokollanalysatoren und Traffic-Generatoren.
USB grabs data-acq spotlight Product News 8/10/2004 Post a comment National Instruments is debuting the first of a line of signal acquisition and generation hardware that plays over Universal Serial Bus. eeProductCenter technical editor Alex Mendelsohn takes a look at the first five new plug-and-play DAQ products from NI.
EEsof rolls advanced EDA test Product News 8/9/2004 Post a comment Agilent Technologies is debuting new EDA capabilities that enable simulation and verification of wireless LAN, 3GPP, and TD-SCDMA circuit designs. Agilent is introducing wireless test benches, sources, and measurement capabilities for its existing Advanced Design System 2004A EDA software from EESof.
Data-acq box mixes, matches industry-standard plug-ins Product News 8/5/2004 Post a comment eeProductCenter Senior Tech Editor Alex Mendelsohn reviews an economical, but high-performance, moderate-speed data acquisition system designed for PC/104 and PC/104-Plus configurations. This integrated system is packaged in a handsome powder-coated steel enclosure for panel, DIN rail, or rack-mount installations. The box supports a stack of up to four PC/104 boards plus a compute engine that'll handle everything from DOS to Windows to Linux.
BASIC datalogger packs Mbytes of removable storage Product News 8/3/2004 Post a comment Expanding its offerings of imported test gear and data acquisition equipment, Saelig Co. is rolling out a new single board computer designed for embedded data logging. It's equipped with a SmartMedia interface for removable storage cards, and can be programmed in BASIC.
Cheap and dirty data logger can be sited almost anywhere Product News 8/2/2004 Post a comment Check out this self-contained 12-bit-resolution data logger. It can be used for measuring and recording temperatures from a variety of thermocouple probes, in applications from industrial process monitoring to concrete maturity testing. This unit accepts any J, K, S, or T thermocouple and provides high-accuracy measurements over wide temperature ranges.
Portable spectrum analyzer serves microwave test Product News 8/2/2004 Post a comment Here's news of a general purpose spectrum analyzer thatuses a 640 x 480-pixel non-color LCD, and can communicate across an RS-232 line. Covering a frequency range of 9-kHz to 2.7-GHz, it can be used for both development work and in production. When equipped with an internal battery, it also lends itself to maintenance and installation of on-site wireless systems.
Receiver-only OTN jitter tester ensures high absolute accuracy, repeatability Product News 8/2/2004 Post a comment Agilent Technologies is moving ahead of the curve, offering substantial state-of-the-art enhancements to its existing OmniBER optical transport network timing jitter tester. This comes at a time when manufacturers and service providers are expressing concern about jitter, especially measurement repeatability and absolute accuracy of results.
As we unveil EE Times’ 2015 Silicon 60 list, journalist & Silicon 60 researcher Peter Clarke hosts a conversation on startups in the electronics industry. Panelists Dan Armbrust (investment firm Silicon Catalyst), Andrew Kau (venture capital firm Walden International), and Stan Boland (successful serial entrepreneur, former CEO of Neul, Icera) join in the live debate.