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Content tagged with Test & Measurement
posted in August 2008
Easing the challenge of RF design, Part 2: Avoiding Interference
Design How-To  
8/28/2008   Post a comment
Designing in a wireless link needn't be a nightmare if you follow some simple guidelines. Jay Tyzzer explains. This part includes how to avoid interference and some knowledge of "the not-so-fine art of creative RF-datasheet writing."
ASA releases Version 6.01 for M1 scope tools
Product News  
8/27/2008   Post a comment
ASA Corp. has released Version 6.01 of its M1 oscilloscope tools software family with a PLL toolkit, designed to provide new views and measurements critical to understanding the behavior of PLLs in a system.
LeCroy debuts test platform for USB 3.0 development
Product News  
8/27/2008   Post a comment
LeCroy Corp. has claimed the industry's first protocol analyzer exerciser system for USB 3.0 (SuperSpeed USB) with the launch of its Voyager validation system.
STATS ChipPac to provide services for Infineon
News & Analysis  
8/27/2008   Post a comment
Singapore-based test and packaging vendor STATS ChipPac has entered into an agreement with Infineon Technologies AG to provide manufacturing services for products based on Infineon's first-generation embedded wafer-level ball grid array technology.
Agilent Technologies introduces RF conformance test system for 3G mobile handsets
Product News  
8/26/2008   Post a comment
Agilent Technologies Inc. announced a new member of its GS-8800 family of RF design verification and conformance test solutions: the GS-8853 3G RF Conformance Test (RCT) system.
Optical spectrum analyzer delivers higher throughput, greater accuracy
Product News  
8/26/2008   Post a comment
Providing higher throughput and greater measurement accuracy, Yokogawa Electric Corporation has released the AQ6370B as an enhanced replacement for the AQ6370 optical spectrum analyzer.
KT spins off crash test company
Product News  
8/25/2008   Post a comment
Aerospace and automotive engineering company Kayser Threde GmbH (Munich, Germany) has spun off its automotive business. Specialized on sensor and dummy technology for automotive crash tests, the new company hopes to tie up to its present global market share of about 70 percent.
Agilent enhances full drive test functionality for wireless measurements
Product News  
8/21/2008   Post a comment
Agilent has announced a new software feature for handheld wireless measurements on its E6474A network optimization platform that turns a standard WiMAX PC card (CPE) into the industry' smallest WiMAX scanning solution for drive test.
Keithley debuts 8x8 RF MIMO test system
Product News  
8/21/2008   Post a comment
Keithley Instruments has claimed the industry's first measurement-grade RF 8x8 MIMO system. The system is used for primary research of next-generation RF MIMO devices and technologies.
Oscilloscopes deliver 10 to 20 times faster throughput
Product News  
8/21/2008   Post a comment
LeCroy has introduced the WavePro 7 Zi series of digital oscilloscopes that enhance the design, debug and validation process in the 1.5-GHz to 6-GHz bandwidth range.
AUTOSAR-compatible XCP software modules for FlexRay ECUs
Design How-To  
8/21/2008   Post a comment
To adjust parameter values in FlexRay ECUs, Auto maker Audi calibrates them via XCP-on-FlexRay. One of Audi's requirements was AUTOSAR compatibility of the XCP embedded software modules in the ECUs. For this purpose Vector modified both the XCP master and slave software so that Audi's electronic developers could perform efficient measurements and calibrations. This was possible thanks to dynamic allocation of the XCP bandwidth for FlexRay
Modules provide precise time, frequency reference to host computers
Product News  
8/19/2008   Post a comment
Symmetricom Inc. announced its latest PCI time and frequency processor modules, the bc635PCI-V2 and GPS referenced bc637PCI-V2, providing precise time and frequency references to host computers and peripheral data acquisition systems.
Agilent Technologies announces integrated simulation solution
Product News  
8/18/2008   Post a comment
Agilent Technologies Inc. has introduced an integrated design flow solution that includes full 3D EM (electromagnetic) simulation for RF Module Design.
Fanfare expands test automation suite
Product News  
8/18/2008   Post a comment
Fanfare has enhanced its iTest test automation product, iTest 3.2, with several new features including support for Ixia's IxNetwork and IxLoad test equipment software.
Hella, Gutman launch diagnostics JV
News & Analysis  
8/18/2008   Post a comment
Automotive tier one Hella KGaA Hueck & Co (Lippstadt) and Gutmann Messtechnik GmbH (Ihringen) have launched a joint venture which aims at the market for vehicle diagnostic systems.
Accurate temperature measurement with Ethernet/LXI interface
Product News  
8/18/2008   Post a comment
The two temperature measurement instruments DT8871 and DT8872 of Data Translation's TEMPpoint range are web-based and Ethernet-ready.
Green Engineering: Yardsticks emerge for gauging energy efficiency
Design How-To  
8/18/2008   Post a comment
Everyone talks about energy efficiency, but how do you measure it?
Berkeley upgrades 8 channel pulse/digital delay generator
Product News  
8/17/2008   Post a comment
Berkeley Nucleonics has upgraded the timing circuitry in its Model 505 pulse/digital delay generator.
Anritsu debuts HSPA Evolution test capability for signaling tester, analyzers
Product News  
8/15/2008   Post a comment
Anritsu claims the first test solutions for the next-generation 3.5G technology with the introduction of HSPA Evolution software packages for its signaling tester and radio communications analyzers.
Software sizes digitally-controlled transmissions
Design How-To  
8/14/2008   2 comments
Simulations optimized oil levels, lubrication, and cooling functions.
Defective airbag sensor triggers BMW recall action
News & Analysis  
8/14/2008   Post a comment
BMW North America will recall between 150.000 and 200.000 vehicles because of problems with a front passenger's seat airbag sensor mat. The voluntary measure shows how an unimpressive part can cause enormous costs.
Understanding the effect of clock jitter on high-speed ADCs (Part 1 of 2)
Design How-To  
8/12/2008   1 comment
The effect of jitter on analog/digital converters is a critical yet sometimes confusing topic; this article clarifies what counts in different applications
Arbitrary waveform generators are 20 percent faster
Product News  
8/11/2008   Post a comment
Tektronix has launched the AWG7000B and AWG5000B series of arbitrary waveform generators (AWGs), touting a 20 percent boost in speed for high-speed serial data and wideband RF test applications.
Reliability of IEC 61000-4-2 ESD testing on components
Design How-To  
8/10/2008   Post a comment
Testing using the IEC systems-level standard tends to provide ambiguous results for components; here's some info on understanding how to reconcile device-level checks with this spec, especially when it comes to the reliability of air discharge results.
Network analyzers extend frequency range up to 20 GHz
Product News  
8/8/2008   Post a comment
Agilent Technologies has announced the addition of the 2/4 port, 20-GHz option to its ENA network analyzers, and a new E5092A configurable multiport test set.
Anritsu enhances economy microwave spectrum analyzers
Product News  
8/7/2008   Post a comment
Anritsu Company has introduced new options for its MS271xB series that take advantage of the economy microwave spectrum analyzers' phase noise of -110 dBc/Hz at 10 kHz offset (typical, 800 MHz) and make it easier to integrate the instruments into legacy manufacturing environments.
Tools for efficient network design and conformance testing
Design How-To  
8/7/2008   Post a comment
The most recent modifications in the LIN 2.1 just have been passed conformance tests. Here's how LIN devices can be validated for their conformance to different parts of the LIN 2.1 specification.
Lightwave component analyzer tests CATV electro-optical components
Product News  
8/7/2008   Post a comment
Agilent introduces the N4374B LCA touted as the only turnkey solution for lightwave component analysis of cable TV electro-optical components.
NI single-board RIO platform targets embedded system deployment
Product News  
8/6/2008   Post a comment
At NI Week, National Instruments has unveiled new single-board RIO devices that provide a low-cost, integrated hardware option for deploying embedded control and data acquisition applications.
Light-guided system eases connector assembly
Product News  
8/6/2008   Post a comment
CAMI Research has introduced a computer-assisted technique for assembling circular connectors used in aerospace and other high-reliability applications.
Video: LabView grows up - A Discussion with James Truchard
News & Analysis  
8/6/2008   Post a comment
James Truchard, CEO and co-founder of National Instruments, offers an historical look at LabView and a prediction of applications and markets where the software technology will go.
UK team develops lab-on-chip for environmental testing
Product News  
8/6/2008   Post a comment
British microfluidics developer Dolomite Ltd and the UK's National Center for Atmospheric Science have developed a generation of microfluidics-based environmental testing equipment for use in air quality monitoring.
Video: Robotics demos at National Instruments Week
News & Analysis  
8/6/2008   Post a comment
National Instruments Week included a robotics demonstration area with Slashbot; Mindstorm NXT-sans, and the Darwin robot.
Protect Your Digital Input Serializer against Lethal Electrical Transients
Design How-To  
8/5/2008   Post a comment
Review the three types of transients commonly experienced in industrial applications and see suggested protection circuitry to ensure reliable data communication between the field inputs and serial output of a digital input serializer.
Multiplexer designed for differential signals
Product News  
8/5/2008   Post a comment
Pickering Interfaces has expanded its switching product line with a PXI module that is capable of switching communications signals carried on 100 ohm differential pair cables.
Collaboration on LTE Protocol Verification
News & Analysis  
8/5/2008   Post a comment
Rohde & Schwarz and Qasara announce a joint programme to verify inter-operability between Rohde & Schwarz's 3GPP LTE Virtual Tester and Qasara's LTE compliant UE protocol stack.
Graphical system design software platform for advanced control
Product News  
8/5/2008   Post a comment
National Instruments (NI) announced LabView 8.6 the latest version of the graphical system design software platform for control, test and embedded system development. With this latest version, engineers can design advanced control systems using programmable automation controllers (PACs) based on FPGAs.
Internet-enabled data logger module
Product News  
8/5/2008   Post a comment
SSV Software Systems now offers the DNP/5370, which is part of the DIL/NetPC family and comes with application-specific accessories. It can be used to save any data onto a local Flash memory card, as well as directly to an online server.
Digital radio test set supports Motorola's Astro SmartNet/SmartZone systems
News & Analysis  
8/4/2008   Post a comment
Aeroflex has announced the release of version 1.7.4 software for its 3900 Series Digital Radio Test Set that includes support for Motorola's Astro SmartNet/SmartZone systems.
GSM/EDGE test system measures RF Tx characteristics
Product News  
8/3/2008   Post a comment
Anritsu's new software allows MS269xA signal analyzers to support 2.5G GSM/EDGE and EGPRS2 mobile phone systems.
Data Translation lowers entry price for high accuracy temperature measurement instruments
Product News  
8/1/2008   Post a comment
Data Translation has introduced lower cost versions of its TEMPpoint temperature measurement instrument.
Judging video quality and artifacts with human subjects and objective metrics
Design How-To  
8/1/2008   5 comments
How video artifacts originate, and how to measure their severity using human test subjects and automated algorithm-based systems.


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