ASA releases Version 6.01 for M1 scope tools Product News 8/27/2008 Post a comment ASA Corp. has released Version 6.01 of its M1 oscilloscope tools software family with a PLL toolkit, designed to provide new views and measurements critical to understanding the behavior of PLLs in a system.
STATS ChipPac to provide services for Infineon News & Analysis 8/27/2008 Post a comment Singapore-based test and packaging vendor STATS ChipPac has entered into an agreement with Infineon Technologies AG to provide manufacturing services for products based on Infineon's first-generation embedded wafer-level ball grid array technology.
KT spins off crash test company Product News 8/25/2008 Post a comment Aerospace and automotive engineering company Kayser Threde GmbH (Munich, Germany) has spun off its automotive business. Specialized on sensor and dummy technology for automotive crash tests, the new company hopes to tie up to its present global market share of about 70 percent.
AUTOSAR-compatible XCP software modules for FlexRay ECUs Design How-To 8/21/2008 Post a comment To adjust parameter values in FlexRay ECUs, Auto maker Audi calibrates them via XCP-on-FlexRay. One of Audi's requirements was AUTOSAR compatibility of the XCP embedded software modules in the ECUs. For this purpose Vector modified both the XCP master and slave software so that Audi's electronic developers could perform efficient measurements and calibrations. This was possible thanks to dynamic allocation of the XCP bandwidth for FlexRay
Hella, Gutman launch diagnostics JV News & Analysis 8/18/2008 Post a comment Automotive tier one Hella KGaA Hueck & Co (Lippstadt) and Gutmann Messtechnik GmbH (Ihringen) have launched a joint venture which aims at the market for vehicle diagnostic systems.
Reliability of IEC 61000-4-2 ESD testing on components Design How-To 8/10/2008 Post a comment Testing using the IEC systems-level standard tends to provide ambiguous results for components; here's some info on understanding how to reconcile device-level checks with this spec, especially when it comes to the reliability of air discharge results.
Anritsu enhances economy microwave spectrum analyzers Product News 8/7/2008 Post a comment Anritsu Company has introduced new options for its MS271xB series that take advantage of the economy microwave spectrum analyzers' phase noise of -110 dBc/Hz at 10 kHz offset (typical, 800 MHz) and make it easier to integrate the instruments into legacy manufacturing environments.
Graphical system design software platform for advanced control Product News 8/5/2008 Post a comment National Instruments (NI) announced LabView 8.6 the latest version of the graphical system design software platform for control, test and embedded system development. With this latest version, engineers can design advanced control systems using programmable automation controllers (PACs) based on FPGAs.
Internet-enabled data logger module Product News 8/5/2008 Post a comment SSV Software Systems now offers the DNP/5370, which is part of the DIL/NetPC family and comes with application-specific accessories. It can be used to save any data onto a local Flash memory card, as well as directly to an online server.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.