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Content tagged with Test & Measurement
posted in August 2011
Electronics enters era of 'systemic risk'
News & Analysis  
8/30/2011   8 comments
The electronics industry has entered an era of "systemic complexity" where growing ecosystems of companies need to collaborate closely, according to a panel of CEOs.
Scopes cover hi-speed/hi-fidelity domains at ESC
News & Analysis  
8/30/2011   1 comment
Tektronix, Inc. has introduced a mixed-domain oscilloscope that delivers the functionality of an scope and a spectrum analyzer in a single instrument. And Rohde & Schwarz has enhanced its real-time digital trigger scope for analyzing extremely small signals with high fidelity. Both companies will exhibit their wares at the Embedded Systems Conference, Boston (Sept. 26 to 29).
Measuring leakage current in RF power transistors
Design How-To  
8/29/2011   5 comments
Around the globe, engineers and technicians using RF power devices have had many concerns regarding the specifications for leakage current, what the specifications mean in terms of the part’s performance in the field, and most importantly, how to properly test/verify that a given part is meeting its printed leakage current specification…
Laird develops EMI shielding effectiveness calculator
Product News  
8/29/2011   1 comment
As information is entered, the calculator computes shielding effectiveness, ?and if there are apertures, it plots their pattern.
Tech Trends: Security concerns for next-generation automotive electronics
Design How-To  
8/26/2011   6 comments
With the remote connectivity now possible with telematics, critical systems could be maliciously tampered with by exploiting vulnerabilities in the car’s embedded systems.
Ten tips for debugging MCUs
Design How-To  
8/25/2011   2 comments
With increasing complexity of microcontrollers and circuits, debugging is becoming increasingly important. But which diagnosis and debug functions are really needed and what is unnecessary?
Parallel IGBTs push power with fewer thermal problems
Design How-To  
8/25/2011   Post a comment
Paralleling IGBTs and diodes within one power module provides higher currents. Such use of several small chips allows better heat dissipation.
Bourns Model 54 and model 56 industrial-grade panel controls
Product News  
8/25/2011   Post a comment
Bourns' industrial-grade panel controls provide the flexibility of a panel control plus push-pull switch or rotary switch in one compact component.
Perfect timing: performing clock division with jitter and phase noise measurements
Design How-To  
8/25/2011   Post a comment
Some practical pointers and observations to assist in situations where clock signals have been divided down from higher frequency voltage-controlled oscillators (VCOs).
More audio-related iPhone apps
Audio DesignLine Blog  
8/24/2011   1 comment
There's no shortage of interesting audio-related apps for the iPhone and iPad - everything from audio test instruments to music creation tools to games - and some can even be had for free.
Analog Devices AD9648 and AD9642 A/D converters
Product News  
8/23/2011   Post a comment
Analog Devices' 14-bit A/D converters meet demanding performance requirements of communications, instrumentation and test and measurement applications.
Dead reckoning fills-in GPS navigation gap
Design How-To  
8/18/2011   9 comments
Dead reckoning aids traditional GPS navigation via intelligent algorithms based on a vehicle’s distance and directional changes during GPS signal interruption.
Hall effect measurements in materials characterization
Design How-To  
8/17/2011   Post a comment
This article addresses how Hall effect measurements are used in materials characterization, trends in the semiconductor industry that drive the need for making these measurements, and factors to consider when selecting measurement instrumentation.
Analog Devices AD8436A and AD8436J RMS-to-DC converter
Product News  
8/17/2011   Post a comment
Analog Devices' RMS-to-DC converter offers a 100 µV to 3 V of usable dynamic range and the ability to measure extremely low signal levels with high accuracy and no drop in settling time.
Ultra-precision op amp pushes to zero drift, 36V rail
Product News  
8/15/2011   3 comments
TI dual-channel OPA2188 offers major improvements in offset voltage drift, initial offset voltage, bandwidth
China puts the squeeze on Taiwan
News & Analysis  
8/12/2011   13 comments
Taiwan test and measurement vendors complain that mainland competitors with government backing are squeezing them out of the Chinese market.
Connector tool joins MapleSim models to dSPACE controller board
Product News  
8/12/2011   Post a comment
Allows real-time implementation in a single environment.
EMI scans verify chip design and accelerate time-to-market
Design How-To  
8/11/2011   3 comments
Very-near-field electromagnetic scanning technology displays spatial and spectral emissions profiles and avoids issues in later, more costly testing at the module, system, or complete vehicle level.
Answering the consumer market’s demand for non-volatile memory
Design How-To  
8/10/2011   1 comment
Non-volatile memory requires substantial R&D investment in terms of both human resources and characterization tools to help them evolve. This is an area in which consumer products manufacturers and their vendors must continue to invest if they are to compete globally.
Coaxial cable assembly supports extreme temperatures
Product News  
8/10/2011   Post a comment
Meggitt Sensing Systems' Endevco model 3090C-XXX is a premium, low-noise softline cable assembly, designed for reliable low and high-temperature operation from -254 to +260°C.
Multibus tool for the reliable analysis and testing of Car2x functions
Product News  
8/7/2011   Post a comment
Vector Informatik is extending its CANoe and CANalyzer tools with additional functions for developing, analyzing and testing the communication between vehicles or between vehicle and infrastructure.
Speech recognition cuts driver distraction
Design How-To  
8/5/2011   8 comments
Design engineers see voice-enabled user interfaces as vital to improving automotive safety in the increasingly complex driver cockpit.
Agilent and UC Davis form millimeter research center
News & Analysis  
8/3/2011   3 comments
Agilent Technologies and the University of California, Davis, will establish the Davis Millimeter Wave Research Center to focus on millimeter wave and THz systems.
The latest updates from NI Week 2011
Design How-To  
8/3/2011   Post a comment
This week National Instruments is holding its annual NI Week in Austin, Texas. Here is a list of the stories we have covered.
Oscilloscope probe accessories — It's the little things that matter
Design How-To  
8/3/2011   1 comment
Probe accessories, including tips, caps, adapters, springs, positioners, clips, and hooks, can help you conveniently make accurate measurements.
Looking back across 50 years of microwave engineering
Design How-To  
8/2/2011   4 comments
Bill Oldfield talks with RF and Microwave Designline, reflecting on the highlights and funny moments in his career, and he offers up some advice for new engineers.
Fleet data loggers tackle real-world testing
Design How-To  
8/2/2011   Post a comment
Notebook-based solutions cannot handle automotive temperature extremes, nor boot up fast enough.
Measurement accuracy/signal integrity prove king of banner specs
Design How-To  
8/1/2011   Post a comment
The relentless pursuit of speed and capacity across the electronics industry is changing the rules for high-end oscilloscopes. While bandwidth used to be the “banner spec” that customers and vendors focused on when evaluating oscilloscopes, the level of precision required to capture and analyze today’s fastest serial and optical signals means measurement accuracy or signal integrity has now emerged as the most important factor.
The evolution of LabView
Blog  
8/1/2011   4 comments
LabVIEW is 25 this year, so it’s a perfect time to pause for reflection and to speculate on the future.


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4 comments
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11 comments
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11 comments
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45 comments
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