Metcalfe’s Law & the Future of Driving
Blog 8/25/2013 24 comments
The automotive industry is moving into a new world where the network effect rules. The value of a car won’t be judged by your car alone, but by how many others also have cars like yours.
Blog 8/22/2013 1 comment
During the design phase, efforts to optimize performance depend on the quality of your test. How do you ensure you've got the best probe for the job?
Benchmarks for Whole Phones Needed
Blog 8/19/2013 27 comments
Benchmarking is a tricky business. There are benchmarks and there are benchmarks. I'm sure I'm not alone in my weariness with reading reports on yet another batch of benchmark results.
5 Keys to LTE Performance Testing
Blog 8/19/2013 7 comments
Given the increased complexity of LTE (with its multitude of new enhanced features and requirements), here's what you need to know about testing equipment before market introduction or deployment
MOSFET Characteristic Variation & Reliability Degradation
Blog 8/15/2013 1 comment
MOSFETs face critical issues such as characteristic variation and reliability degradation. Takuro Nishimura of Agilent Technologies discusses methods to set up measurement apparatus, explore RTN and BTI, and solve characteristic variation and reliability degradation issues
MEMS Nixes Quantum Light Fluctuations
News & Analysis 8/14/2013 9 comments
Caltech researchers harnessed MEMS resonators to nix the tiniest quantum fluctuations in laser light, potentially enabling a new generation of ultra-precise measurement instruments.
Test Challenges for New Engineers
Blog 8/9/2013 9 comments
Steve Sandler has a great sense of humor and an interesting technical background. He is one of the most curious and enthusiastic people I’ve met. I recently asked him to be a part of my Profiles in Test series.
Where Tech Projects Meet Social Change
India Chip Chat 8/7/2013 10 comments
In the recent "Himalayan tsunami," more than 10,000 pilgrims visiting Uttarakhand in north India went missing and entire villages were swept away. Could any tech projects have possibly saved them?
Turn Debug, Validation & Test on Their Heads
Blog 8/2/2013 2 comments
For 30 years or more we’ve clung to an outside-in point of view based on external testers and probes. Over the last few years though, it has become apparent that we can see more when we look from the inside out.