Metcalfe’s Law & the Future of Driving Blog 8/25/2013 24 comments The automotive industry is moving into a new world where the network effect rules. The value of a car won’t be judged by your car alone, but by how many others also have cars like yours.
Benchmarks for Whole Phones Needed Blog 8/19/2013 27 comments Benchmarking is a tricky business. There are benchmarks and there are benchmarks. I'm sure I'm not alone in my weariness with reading reports on yet another batch of benchmark results.
5 Keys to LTE Performance Testing Blog 8/19/2013 7 comments Given the increased complexity of LTE (with its multitude of new enhanced features and requirements), here's what you need to know about testing equipment before market introduction or deployment
MOSFET Characteristic Variation & Reliability Degradation Blog 8/15/2013 1 comment MOSFETs face critical issues such as characteristic variation and reliability degradation. Takuro Nishimura of Agilent Technologies discusses methods to set up measurement apparatus, explore RTN and BTI, and solve characteristic variation and reliability degradation issues
MEMS Nixes Quantum Light Fluctuations News & Analysis 8/14/2013 9 comments Caltech researchers harnessed MEMS resonators to nix the tiniest quantum fluctuations in laser light, potentially enabling a new generation of ultra-precise measurement instruments.
Why a Little Ringing in Step Load Isn’t Such a Little Problem Blog 8/14/2013 2 comments When the step load occurs at the ringing frequency, the resulting output voltage response is much larger than in the natural damped response. These levels can further exacerbate the noise, and in some cases the ringing can become large enough to cause circuit stress.
Test Challenges for New Engineers Blog 8/9/2013 9 comments Steve Sandler has a great sense of humor and an interesting technical background. He is one of the most curious and enthusiastic people I’ve met. I recently asked him to be a part of my Profiles in Test series.
Where Tech Projects Meet Social Change India Chip Chat 8/7/2013 10 comments In the recent "Himalayan tsunami," more than 10,000 pilgrims visiting Uttarakhand in north India went missing and entire villages were swept away. Could any tech projects have possibly saved them?
Turn Debug, Validation & Test on Their Heads Blog 8/2/2013 2 comments For 30 years or more we’ve clung to an outside-in point of view based on external testers and probes. Over the last few years though, it has become apparent that we can see more when we look from the inside out.
My Mom the Radio Star Max MaxfieldPost a comment I've said it before and I'll say it again -- it's a funny old world when you come to think about it. Last Friday lunchtime, for example, I received an email from Tim Levell, the editor for ...
A Book For All Reasons Bernard Cole1 Comment Robert Oshana's recent book "Software Engineering for Embedded Systems (Newnes/Elsevier)," written and edited with Mark Kraeling, is a 'book for all reasons.' At almost 1,200 pages, it ...