Aehr's sales drop 26% sequentially in quarter, causing wider loss News & Analysis 9/25/2001 Post a comment FREMONT, Calif. -- Aehr Test Systems here today reported net sales fell 68% to $2.8 million in the company's fiscal first quarter, ended Aug. 31, compared to $8.7 million in the period last year. Sales sequentially declined 26% from $3.8 million in the prior fiscal quarter, said the company.
Advantest begins trading on NYSE, but sales to fall 53% in fiscal 2002 News & Analysis 9/17/2001 Post a comment NEW YORK -- Advantest Corp. here today began trading its shares on the New York Stock Exchange (NYSE), but the prospects for the Japanese company look gloomy for 2001.
The Tokyo-based supplier of automatic test equipment (ATE) began trading its American Depositary Receipts (ADRs) on the NYSE. The ADRs will be traded under the symbol "ATE."
Teradyne CEO says terrorist attacks may impact frail business conditions News & Analysis 9/13/2001 Post a comment BOSTON--Teradyne Inc. here today announced it was extending its cost-cutting actions in response to weak spending on test equipment and the worldwide economic downturn. Teradyne also said its loss in the current quarter will be at the low end of its previous estimate, but greater than the earnings consensus of financial analysts.
Schlumberger adds broadband capabilities on VLSI test system News & Analysis 9/6/2001 Post a comment SAN JOSE -- Schlumberger Semiconductor Solutions here expanded the capabilities for its VLSI logic tester by offering a broadband channel option for the system.
The company will offer the broadband channel option on its EXA3000 System-on-a-Chip (SoC) tester. This will enable the system to test high-performance MPEG decoders and other devices used in DVDs, set-top boxes, HDTVs, and cellular baseband applications.
Low noise density reduces test time for mixed-signal ICs News & Analysis 9/5/2001 Post a comment Initially, mixed-signal ATE instrumentation designs focused on analog bandwidth for low and high power dc, ac (both precision low frequency and high frequency) and RF/Microwave options. Today, ATE must consider noise density as part of the test equation. Teradyne's engineers describe the parameters.
In conjunction with unveiling of EE Times’ Silicon 60 list, journalist & Silicon 60 researcher Peter Clarke hosts a conversation on startups in the electronics industry. One of Silicon Valley's great contributions to the world has been the demonstration of how the application of entrepreneurship and venture capital to electronics and semiconductor hardware can create wealth with developments in semiconductors, displays, design automation, MEMS and across the breadth of hardware developments. But in recent years concerns have been raised that traditional venture capital has turned its back on hardware-related startups in favor of software and Internet applications and services. Panelists from incubators join Peter Clarke in debate.