Aehr's sales drop 26% sequentially in quarter, causing wider loss News & Analysis 9/25/2001 Post a comment FREMONT, Calif. -- Aehr Test Systems here today reported net sales fell 68% to $2.8 million in the company's fiscal first quarter, ended Aug. 31, compared to $8.7 million in the period last year. Sales sequentially declined 26% from $3.8 million in the prior fiscal quarter, said the company.
Advantest begins trading on NYSE, but sales to fall 53% in fiscal 2002 News & Analysis 9/17/2001 Post a comment NEW YORK -- Advantest Corp. here today began trading its shares on the New York Stock Exchange (NYSE), but the prospects for the Japanese company look gloomy for 2001.
The Tokyo-based supplier of automatic test equipment (ATE) began trading its American Depositary Receipts (ADRs) on the NYSE. The ADRs will be traded under the symbol "ATE."
Teradyne CEO says terrorist attacks may impact frail business conditions News & Analysis 9/13/2001 Post a comment BOSTON--Teradyne Inc. here today announced it was extending its cost-cutting actions in response to weak spending on test equipment and the worldwide economic downturn. Teradyne also said its loss in the current quarter will be at the low end of its previous estimate, but greater than the earnings consensus of financial analysts.
Schlumberger adds broadband capabilities on VLSI test system News & Analysis 9/6/2001 Post a comment SAN JOSE -- Schlumberger Semiconductor Solutions here expanded the capabilities for its VLSI logic tester by offering a broadband channel option for the system.
The company will offer the broadband channel option on its EXA3000 System-on-a-Chip (SoC) tester. This will enable the system to test high-performance MPEG decoders and other devices used in DVDs, set-top boxes, HDTVs, and cellular baseband applications.
Low noise density reduces test time for mixed-signal ICs News & Analysis 9/5/2001 Post a comment Initially, mixed-signal ATE instrumentation designs focused on analog bandwidth for low and high power dc, ac (both precision low frequency and high frequency) and RF/Microwave options. Today, ATE must consider noise density as part of the test equation. Teradyne's engineers describe the parameters.
My Mom the Radio Star Max MaxfieldPost a comment I've said it before and I'll say it again -- it's a funny old world when you come to think about it. Last Friday lunchtime, for example, I received an email from Tim Levell, the editor for ...
A Book For All Reasons Bernard Cole3 comments Robert Oshana's recent book "Software Engineering for Embedded Systems (Newnes/Elsevier)," written and edited with Mark Kraeling, is a 'book for all reasons.' At almost 1,200 pages, it ...