Heard on the Beat: Intel seeks 'open' flash testers News & Analysis 9/23/2004 Post a comment Reports have surfaced that Intel is looking to procure a new round of next-generation, flash-memory testers, based on an "open architecture." The chip giant is currently evaluating next-generation, flash-memory testers from Advantest, Agilent and Credence, according to sources.
Dual A/D converter consumes little power at high speeds Product News 9/21/2004 Post a comment National Semiconductor offers a dual high-performance CMOS analog-to-digital converter that the company says uses significantly less power than competitive products while providing the GHz speeds necessary for reliable measurements of high-frequency signals. Editor Bettyann Liotta takes you in for a closer look at this product and how it compares to other similar products in the industry.
Agilent, VXI Technology roll out LXI standard Product News 9/21/2004 Post a comment Combining the attributes of rack-and-stack instruments and modular test capabilities rolled into compact and flexible packages, Agilent Technologiesand VXI Technologyare debuting a new LAN extensions for instrumentation standard called LXI. It's billed as the industry's next-generation LAN-based modular platform standard for automated test systems.
Jitter analysis software enhances Tektronix scopes Product News 9/20/2004 Post a comment Venerable oscilloscope maker Tektronix announces the availability of a software package for making jitter and timing measurements on the company's high performance oscilloscopes. Priced at about $4500, Tek's new software's measurement wizard uses the company's domain knowledge to provide step-by-step guidance for users. You can use this new package to measure jitter, even on complex clock and data signals.
New Use Models Boost Equipment Utilization News & Analysis 9/20/2004 Post a comment Logic analyzers play a critical role in validation of today's sophisticated high-speed digital designs. With the ability to measure real-time activity of system components, logic analyzers provide key insight for effective functional validation. In this article, Agilent Technologies' Joel Woodward explores new advances in logic analysis use models that allow teams to better utilize their logic analysis investment.
Opinion: Why Ethernet reigns supreme for test-and-measurement instrumentation Product News 9/17/2004 Post a comment The economy, speed, and virtually unlimited distance potential of Ethernet-based communications is fueling the growth of Ethernet-ready instrumentation. Increasingly, users are noting the performance and cost disparity between Ethernet and the RS-232, RS-422, and IEEE-488/GPIB. Author Eric E. Bloam, of Keithley Instruments, points out why Ethernet-ready instrumentation is alive and well. His observations include an in-depth eeProductCenter bonus technical tutorial.
Rohde & Schwarz stellt sich auf Digital-TV ein News & Analysis 9/17/2004 Post a comment Die digitale Welle rollt auf die Fernsehbranche zu. Vor allem in Gestalt des Standards DVB-H wird die Digitalisierung die Sendeanstalten in den nächsten Monaten und Jahren intensiv beschäftigen. Der Messgerätehersteller Rohde & Schwarz begleitet die Einführung mit einem umfangreichen Portfolio von entsprechenden Produkten.
RFID tags ubiquitous by 2010, MIT prof predicts News & Analysis 9/15/2004 Post a comment Kevin Ashton, vice president of ThingMagic Inc. and cofounder of the MIT Auto-ID Center, told a keynote audience at the Embedded Security Seminar conference in Boston that global RF sensor networks will be ubiquitous to the point of invisibility within a few years.
Multi-channel 105-MHz data converter PMC module is DC-coupled Product News 9/15/2004 Post a comment Board maker Interactive Circuits and Systems is debuting a DC-coupled version of a previously released 4-channel PMC module. The latest board can handle high-speed baseband sampling requirements as needed for communications, radar, and test-and-measurement applications. The DC-coupled inputs are especially useful for baseband sampling in software defined radios.
TDR helps isolate electronic package faults News & Analysis 9/15/2004 Post a comment Time Domain Reflectometry (TDR) measurement methodology is increasing in importance as a non-destructive method for fault location in electronic packages. In this multipart series, TDA Systems' famous fault finder, Dima Smolyansky, shows some package faults like shorts and opens, and explains how they are likely to show up on TDR measurement screen. The first part, available here, offers a review of Time Domain Reflectometry basics. Part 2, also available in next week's Planet Analog magazine, b
Measurement Software - connects design and test Product News 9/14/2004 Post a comment National Instruments announced NI SignalExpress, an interactive software environment for acquiring, comparing, automating, testing and storing measurement signals. With SignalExpress, engineers can use virtual instrumentation on the benchtop to save valuable time by automating measurements for design, debugging, characterization and validation labs.
Agilent receives patent on USB test spec News & Analysis 9/13/2004 Post a comment Agilent Technologies Inc. (Palo Alto, Calif.) said it has obtained a patent that describes a method to use the Universal Serial Bus (USB) to communicate with a message processing device, including some aspects of GPIB emulation.
Tek's new 4-channel portable scopes take to lab or field Product News 9/13/2004 Post a comment Oscilloscope maker Tektronix announces a new line of portable industrial-oriented 4-channel digital scopes, along with some powerful software and dedicated probes. These instruments are designed with industrial power designers and technicians in mind. Click on this story to read Tek's release notes and eeProductCenter Senior Technical Editor Alex Mendelsohn's observations.
Static monitors measure surface voltage Product News 9/10/2004 Post a comment TBA Electro Conductive Products (ECP) introduces two static monitors that offer a convenient and reliable way to measure surface voltage. Both instruments measure surface voltage in kV at 100-mm, with the ECP 1606 model having a range of 100-kV at 100-V resolution, while the more accurate 1606E model offers a 20-kV range and 10-V resolution.
Tektronix tools target next-gen video compression Product News 9/8/2004 Post a comment Instrumentation giant Tektronix is debuting a new software-based analyzer that gives you the ability to investigate compressed video data that's been encoded using various video standards. Tek is also announcing the addition of H.264/AVC and Windows Media 9 support for its MTM400 MPEG Transport Stream Monitor.
Embedded optical time-domain reflectometry modules can work as sensors Product News 9/7/2004 Post a comment Anritsu's got some nifty optical time-domain reflectometry modules that can be applied to quite a wide variety of applications. Not only can they be used to maintain cabling in lightwave-based networks, but they also have applicability as sensors. eeProductCenter Senior Tech Editor Alex Mendelsohn gives them an approving nod.
FPGA core to handle spectrum analyzer IF filtering Product News 9/7/2004 Post a comment Here's an interesting product development slated for test instrument vendors making spectrum analyzers. It's a digital replacement for analog IF filtering typically used in spectrum analyzers. Now available as an intellectual property core for embedding in FPGAs, it can simplify and make less risky the embedding of high performance digital designs into spectrum analysis, whether it's for general-purpose test instruments or application-specific equipment.
UMTS-Protokolltester erhält C++-Programmierschnittstelle News & Analysis 9/7/2004 Post a comment Das Wideband-CDMA-Messgerät für Mobiltelefone CRTU-W von Rohde & Schwarz ist jetzt auch für Signalisierungstests in Forschung und Entwicklung einsetzbar. Das Haupteinsatzgebiet des Testers, WCDMA Conformance Testing, bleibt davon unberührt, die Erweiterung erfolgt über eine zusätzliche Softwareschnittstelle.
Aeroflex, Motorola ink accord to distribute RF test products Product News 9/2/2004 Post a comment Test-and-measurement house Aeroflex inks an agreement letting Motorola Communications and Electronics market and distribute Aeroflex's line of wireless test products in the US and Canada. Wares include Aeroflex's line of radio test systems, spectrum analyzers, RF power meters, signal generators, and microwave test gear.
LeCroy to acquire test software company News & Analysis 9/2/2004 Post a comment Test instrument supplier LeCroy Corp. (Chestnut Ridge, N.Y.) has signed a definitive agreement to acquire Computer Access Technology Corp. (Santa Clara, Calif.), in a stock transaction valued at $81 million, plus options.
PC-hosted software rides herd on CAN Bus Product News 9/1/2004 Post a comment Here's a review of new PC-based software and hardware that can acquire data from an in-vehicle network. Use it to gather engineering data to analyze a vehicle's performance, using data from networks conforming to both CAN and J1850 standards. eeProductCenter Senior Tech Editor Alex Mendelsohn describes the system in detail.
Agilent powers up newest DC supplies with multiple I/Os Product News 9/1/2004 Post a comment Hot on the heels of Agilent Technologies's recent announcement of new modules and paralleling enhancements for its N6700 MPS power sources, the company is rolling out its newest N5700 Series. Billed as system DC power supplies, they offer what Agilent claims is the industry's highest power densities, with one unit in the mix providing up to 1.5-kW in a space-saving 1U-high package.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.