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Content tagged with Test & Measurement
posted in September 2010
Agilent joins PXI Systems Alliance board
News & Analysis  
9/30/2010   2 comments
Agilent Technologies Inc. has joined seven other sponsor-level member companies on the board of directors of the PXI Systems Alliance. The primary goal of the PXISA is to improve the effectiveness of CompactPCI-based solutions in measurement and automation through use of the PXI specification
Tools aid debug and validation to MIPI M-PHY specification
Product News  
9/28/2010   Post a comment
At the MIPI Alliance All-Members meeting in Athens, Greece, Tektronix Inc. has introduced tools that enable engineers to use its DPO/DSA/MSO70000B series oscilloscope to start performance verification and debug for the MIPI Alliance M-PHY standard.
NKK Switches KP series of RGB illuminated pushbuttons
Product News  
9/27/2010   8 comments
NKK Switches' KP Series of illuminated miniature pushbutton switches provides design engineers with many options that enhance and complete front panels needing an innovative and modern look and feel.
Agilent: Help for testing wideband transmitters
RF & Microwave Designline Blog  
9/26/2010   3 comments
I just heard from the team at Agilent that they have a new app note on making wideband radar and satcom measurements.
The electronic ghost in the optical network
Engineering Investigations  
9/23/2010   41 comments
Engineer grapples with consequences of vaguely-specified characteristics
Audio Precision opens UK office
News & Analysis  
9/22/2010   Post a comment
Audio Precision (AP), provider of audio test and measurement instruments, has opened an office in the United Kingdom to support customers of its audio analyser instruments and drive new sales in one of the top audio design markets in the world.
Maxim's MAX6581 8-channel temperature sensor
Product News  
9/17/2010   Post a comment
Maxim's latest temperature sensor provides ±1 degree Celsius accuracy to monitor multiple hot spots with only a single I2C address.
LeCroy ExpressCard 2.0 Interposer for PCI Express
Product News  
9/16/2010   Post a comment
LeCroy Corp. unveiled a new ExpressCard 2.0 Interposer for its SummitPCI Express Protocol Analyzer product line.
Tektronix expands benchtop portfolio with timer/counter/analyzers
Product News  
9/14/2010   1 comment
The FCA3000 and FCA3100 series of timer/counter/analyzers and the MCA3000 series of microwave counter/analyzers have been developed by Tektronix to integrate with its other bench instruments, such as oscilloscopes and arbitrary/function generators.
Texas Instruments' THS770006 fully differential operational amplifier
Product News  
9/13/2010   Post a comment
TI has enhanced its latest operational amplifier to deliver 16-bit full-scale precision up to 200 MHz IF.
Linear Technology's LTC4365 reverse protection controller
Product News  
9/13/2010   1 comment
Linear is offering an overvoltage, undervoltage and reverse protection controller for portable instrumentation, industrial automation and automotive applications that require windowed supply protection.
Agilent launches broad-spectrum assault into modular PXI and AXIe markets
Product News  
9/13/2010   Post a comment
Lots of boards and advanced chassis—46 in all—mark company's entry into modular test and measurement instrumentation arena
CEA-Leti prototypes scalar magnetometer for space flights
Product News  
9/10/2010   Post a comment
The CEA-Leti research center has developed, together with CNES, a scalar magnetometer that will be deployed in the three satellites of the SWARM space mission, a project of the European Space Agency.
AT4 adds MIMO 4x2 capabilities to test set
Product News  
9/7/2010   Post a comment
AT4 Wireless has added the LTE Rel-8 MIMO 4x2 option to its E2010 broadband wireless test set.
Embedded instruments unlock validation & test for Xeon 5500 processor boards
Product How-To  
9/7/2010   Post a comment
The advanced microarchitecture and high interconnect speeds on circuit boards designed around the Intel Xeon Processor 5500 Series (codenamed Nehalem) present design validation and test challenges for board designers and manufacturers. Older legacy test systems typically involve a probe of some sort making physical contact with the circuit board or chip pins on the board.
The mysterious case of the microprocessors memory errors
Engineering Investigations  
9/2/2010   12 comments
Something lurking out there among the African Violets was wreaking havoc with the greenhouse control system


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