High speed digital test and dynamic protocol reconfiguration Design How-To 9/29/2011 1 comment There are a variety of good tools on the market for debugging digital designs. Each has advantages and disadvantages that solve specific niche problems. No tool can solve all problems at all speeds and for all protocols. This paper provides a discussion of the relative merits and demerits of high speed digital test approaches and dynamic protocol reconfiguration.
Tower, Presto offer SiGe test services News & Analysis 9/27/2011 Post a comment Specialist foundry Tower Semiconductor Ltd, which trades under the name TowerJazz, has announced collaboration with Presto Engineering Inc. to provide engineering services to customers using Tower's silicon-germanium process technology.
LTE sales overtake WiMax, says analyst News & Analysis 9/21/2011 3 comments The market for mobile communications infrastructure is growing strongly, according to market research firm Infonetics Research Inc., which said that LTE infrastructure equipment spending greater than that of WiMax for the first time in 2Q11.
Audio analyzer with new digital audio interface options Product News 9/20/2011 Post a comment Agilent Technologies' enhanced U8903A audio analyzer features new digital audio interface options that expand the instrument’s capabilities with AES3, SPDIF and DSI (digital serial interface) formats for versatile, high-performance analog and digital audio testing.
Intelligent sensor, algorithms improve battery management Design How-To 9/19/2011 2 comments More than half of the vehicle breakdowns that are caused by the electrical system can be traced back to the lead-acid battery and could have been avoided by knowledge of the battery state. A battery management system provides the necessary information by fast and reliable detection of the State-of-Charge, State-of-Health, and State-of-Function in terms of cranking capability.
Aeroflex donates equipment to Lancaster Uni News & Analysis 9/14/2011 Post a comment The Aeroflex Wireless Broadband Laboratory has been opened in the Lancaster University’s School of Computing and Communications at InfoLab21, Lancaster’s world-class centre of excellence for research in information and communication technologies.
Hunting noise sources in wireless embedded systems Design How-To 9/14/2011 1 comment In an embedded system design, especially one bringing together high-speed RF and serial or parallel components, noise can come from almost anywhere. Without clues as to the sources of noise, debugging can be time consuming and tedious. With a mixed domain oscilloscope (MDO) however, engineers can see noise sources like spectrum splatter during turn-on, drain voltage power supply coupling, or other cross-coupled emission events and correlate these events to specific logic states or analog circuit
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.