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posted in November 2013
Spansion Exec Reassures Fujitsu Customers
News & Analysis  
11/25/2013   9 comments
The most tangible technology advances, after Spansion acquired Fujitsu Semiconductor's MCU/analog business, will come from the adoption of Spansion’s proprietary eCT technology in embedded MCUs -- to be released in 2015.
5 MEMS Chips Debut at MEMS Exec Congress
News & Analysis  
11/18/2013   4 comments
New micro-electro-mechanical system (MEMS) chips were announced at the recent MEMS Executive Congress (Napa, Calif., Nov. 7-9).
Will Rohm's Fuel Cell Gambit Pay Off?
News & Analysis  
11/11/2013   13 comments
Among a handful of promising companies whose hearts were set on the portable fuel cell market, Japan's Rohm has recently become the first to blink. Although not ditching its nascent fuel cell business, Rohm decided to change focus.
EE Times Community Weighs In on Toyota Case
News & Analysis  
11/7/2013   27 comments
EE Times readers took Toyota’s unintended acceleration case to heart. After all, Toyota’s failures, pointed out by the expert witnesses, aren’t just Toyota’s problems. Its failures are relevant to all the hard choices engineers make.
Slideshow: NI Days Keynote Address
News & Analysis  
11/6/2013   4 comments
At NI Days 2013 in Boston, attendees saw product demos and some smashing.
Maxim's USB Emulator Consolidates In-Car Device Charging
News & Analysis  
11/5/2013   17 comments
Have USB, will travel. Maxim has developed an automotive-quality USB solution that can recognize any portable device and charge directly from car battery.


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As data rates begin to move beyond 25 Gbps channels, new problems arise. Getting to 50 Gbps channels might not be possible with the traditional NRZ (2-level) signaling. PAM4 lets data rates double with only a small increase in channel bandwidth by sending two bits per symbol. But, it brings new measurement and analysis problems. Signal integrity sage Ransom Stephens will explain how PAM4 differs from NRZ and what to expect in design, measurement, and signal analysis.

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