Breaking News
Blog

Ac scan needed for nanoscale device testing

NO RATINGS
View Comments: Newest First | Oldest First | Threaded View
Stephen Xie
User Rank
Rookie
New methods for nanometer process selicon defect detect
Stephen Xie   10/16/2013 4:55:09 AM
NO RATINGS
AC_scan compare with traditional dc_scan has more advantage. Actually, more times we use scan for transitor defect detecting. For smaller gate and complex circuits. We cannot generate enough pattern vectors to coverage all logic. Although, we generate large vectors. The speed is the bottle necking for this also. 

AC_scan can run very fast and save test time. The scan_shift can detect more accurate location. Past 5-years IC testing, I found the more useful function is time delay detecting. For example, the IC when work under 100MHz, all function's are acceptable. When frequency goes high and high, some parts will unstable or fail. Why? Does the circuit design has problem,maybe? Manufacture issue, maybe? Or test method need improve,maybe? Test hardware need optimize, maybe? 

So many factors will affect this. But, fortunately some chips passed. And we can remove test environment & design issues. We think over to find some ways to compare the pass and fail chips.  At end , we found why frenquency affect?

  AC_scan with step compare, it is good way for this. Generate diffrent vectors and run with different frequencies, we can detect the fail location. After PFA, the fail should manufacture issue. Some bridge need  improve.

At present, many test engineers will use AC_scan for defect detecting. It is not end. Do we have more good ways for this? Yes.. let's discuss for next page.

 

 

More Blogs
Moving forward, semiconductor industry trends can be predicted by the 3V model of big data -- Velocity, Variety, and Volume.
A evaluation of the pros, cons, and potential obstacles to Requirements-Driven Verification and Test.
Got a quick design trick to share with the EDN/EETimes community? Now's your chance to show off. DesignCon has opened its Trick for a Treat giveaway.
Based on the technology available to a 10-year-old boy in 1965, can anyone solve Ivan's 49-year-old conundrum?
Nanette Collins continues on her brave quest to educate engineers as to the value of good PR and marketing.
Radio
NEXT UPCOMING BROADCAST
EE Times Senior Technical Editor Martin Rowe will interview EMC engineer Kenneth Wyatt.
Top Comments of the Week
Like Us on Facebook

Datasheets.com Parts Search

185 million searchable parts
(please enter a part number or hit search to begin)
EE Times on Twitter
EE Times Twitter Feed
Flash Poll