Design Con 2015
Breaking News
Blog

I ain't cut out for this high-falutin' math

Don Dodge
1/25/2011 01:03 PM EST

 6 comments   post a comment
NO RATINGS
View Comments: Oldest First | Newest First | Threaded View
bcarso
User Rank
Rookie
re: I ain't cut out for this high-falutin' math
bcarso   1/26/2011 5:45:14 PM
NO RATINGS
Love it! But how did Big Blue ever sanction the superannuated tech's departure from the dress code? I guess he must have just been that good.

zeeglen
User Rank
Blogger
re: I ain't cut out for this high-falutin' math
zeeglen   1/26/2011 7:34:55 PM
NO RATINGS
Possibly this guy was a lab-type engineer whom the techs called for in desperation. The clue is the "white coat". Being one who did not normally visit customers the suit-and-tie policy might not apply.

bcarso
User Rank
Rookie
re: I ain't cut out for this high-falutin' math
bcarso   1/27/2011 4:41:07 PM
NO RATINGS
Good conjecture. More likely the age factor was just incidental---although clearly he knew his stuff.

daleste
User Rank
CEO
re: I ain't cut out for this high-falutin' math
daleste   1/29/2011 8:37:35 PM
NO RATINGS
Great story. I guess this is why you can't get schematics any more. Now everything is integrated into a chip, so it is hard to hack the hardware. But there is so much software to mess with.

fej1
User Rank
Rookie
re: I ain't cut out for this high-falutin' math
fej1   2/2/2011 4:32:36 AM
NO RATINGS
I too have an amusing IBM story, but it's not a prank or joke. http://laughtonelectronics.com/comm_mfg/commercial_ibm1130.html (FWIW the other content on my site is comparatively serious.)

More Blogs
Have you considered how programmable RF devices might enhance the products that you design?
There are many factors that contribute to radiated emissions problems. How well do you know them?
An EE Times community member poses an interesting question: Could the manufacturers of SMD components modify their center of balance?
Electrical engineering schools wanting modern test equipment will do well to befriend test-equipment companies.
The SoC interconnect is one area in which efforts to reduce power consumption need be re-evaluated.
Radio
NEXT UPCOMING BROADCAST
EE Times Senior Technical Editor Martin Rowe will interview EMC engineer Kenneth Wyatt.
Top Comments of the Week
Like Us on Facebook

Datasheets.com Parts Search

185 million searchable parts
(please enter a part number or hit search to begin)
EE Times on Twitter
EE Times Twitter Feed
Flash Poll