Hi Max, I recently discovered your new EE Times Prototyping Designline, which caught my interest. During my 30 years of engineering in the semiconductor industry, I have been fortunate enough to see all facets of this global business through designing and developing many custom applications supporting assembly test and manufacturing requirements.
As engineers in this space, we all feel the daily demands of this never-ending changing market. In order to remain competitive, new products are required in rapid fashion with customers determining market timing. This, in itself, is a major undertaking; however, we also have a few business measurement acronyms to consider during these endeavors DFM, DFT, OEE, KPI, ASP, GM, etc...
From my experience, prototyping is an area that is most critical for new product development, but one that tends to be neglected when it comes to capital, automation, processing, and -- most importantly -- knowledge sharing.
I would be willing to bet that many prototype lines today are subject to missed market opportunities because they are still running with some archaic legacy application or numerous "Master" spreadsheets.
Some years ago, I hired a key addition to my engineering development team. Although not an engineer, this individual was proficient in web-based applications and database design, and could provide interfaces for business enterprise integration.
This web-based technology allowed for new engineering design concepts, where new levels of intelligence, management, and visibility could not only be incorporated, but could also be dynamic.
A few years ago, I was approached by a senior staff member and asked if it was possible to develop a portal specifically for managing several prototype lines. At that time, these lines were underutilized and had limited procedures with constant design rule violations. Needless to say, every build was a priority.
After several meetings of working directly in the prototype lines, the goals, and objectives of the application, were defined as follows:
- Goals: Design a solution that directly interfaces the design engineering community with all prototype centers. The portal should promote, sustain, and notify a collaborative assembly development environment that provides real time, historical, and assembly data with a genealogy trace to the material sets used.
- Objectives: Web portal provides a collaborative set of tools to organize and record all prototype build specifications, data collects, and manufacturing metrics.
This involved designing a custom database that specifically addresses prototype and packaging assembly needs as follows:
- Clean interface with input modules designed specifically for multi-chip module assembly.
- Individual modules by process operation to improve clarity, accuracy, and cycle time (die attach, wire bond, mold, laser mark, singulation).
- Transfers to global prototype lines.
- Administration rights allowing for complete portal management.
- Real-time data processing for build status, alerts, events, action items, and hold conditions.
- Consolidated manufacturing data collects -- prototype performance indicators.
- Transform prototype data collections into an active knowledge framework with search engines allowing for historical data access with "drill down" capability providing greater analysis.
- Capture all build information (specifications, wafers, BOMs, assembly data results, material genealogy images).
The results were as follows:
- General: Paperless, searchable, elimination of emails and phone, live status, e-notification system.
- Overall efficiency: Parallel builds, increased number of builds, reductions in cycle times, hold times, and approval times.
- Knowledgebase established: Complete genealogy of BOM's, die placements, wire-bond lengths, loop heights, bond line thickness, RF tuning, PCB's, saw accuracy, etc.
- Design user forum established.
- Real-time key performance indicators: Builds (per schedule, product line, product, design engineer, customer) ; Equipment metrics: number of die placements, number of wire-bonds, etc.