Self-driving cars and device-level security pose challenges for chip makers that will be discussed at the annual Semicon West event in July.
Connected, autonomous cars present a huge emerging opportunity for electronics suppliers. They also present new and potentially disruptive challenges across much of the IC sector, from the need for wider adoption of automotive quality standards for fault testing and documentation to closer collaboration across the supply chain and some agreement on new security solutions.
Chip makers now need to demonstrate testing of up to 90-99% of random errors in design for any automotive system that could cause injury on failure.
“This is very challenging because these new ICs may have 200-300 million gates, so you would possibly need to test for 4x-5x that many faults,” says Jeff Hutton, a senior director for automotive at Synopsys who will speak at the Extended Supply Chain Forum, one of eight new forums at SEMICON West, July 12 in San Francisco. “Some companies estimate fault testing on very large designs will take more than a year,” he said.
All these faults have to be documented for trace back in case of failure. Similar testing, documentation and traceability will be required in manufacturing at each level of the supply chain, including cellular and cloud providers if they are involved in assisted or autonomous driving, he notes.
Automotive qualification for ADAS will mean fault testing and documentation of hundreds of millions of gates. Source: Synopsys
About 34 of Synopsys’ top 40 customers are now involved in designing devices for the future of autonomous driving, up from only about five a few years ago. “It’s not only the makers of the sensors and the processors used in the car, but devices for the connectivity and the cloud that will be impacted as everyone gets into this space,” he said.
“There will be much more interaction needed, because it’s much more complicated than anything we’ve done before,” he added.
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