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Location Is Everything: Improving Performance with Interactive LDE Estimation
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How to build a microcontroller-based functional tester
Book excerpt – The art of hardware architecture, part 3
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The Fast Track to 3D-IC Testing
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Book excerpt – The art of hardware architecture, part 2
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How formal MDV can eliminate IP integration uncertainty
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Book excerpt – The art of hardware architecture, part 1
HW/SW co-development (with finally some emphasis on software)
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Reducing signoff corners to achieve faster 40 nm SOC design closure
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Top 10 automotive electronics stories of 2011
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Single event effects (SEEs) in FPGAs, ASICs, and processors, part II: mitigation
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Hi, I'm Brian Bailey and I'm the editor of the EDA DesignLine. If you are interested in submitting a technical article, blog or product announcement, or just want to reach out say hello, you can call me at 503-352-4336 or email me at 
