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DESIGN West RF preview
Janine Love
3/20/2012 9:46 AM EDT
If you are heading to DESIGN West this year (March 26-29, McEnery Convention Center in San Jose), there are a lot of great things for RF & microwave engineers. I’ve compiled some interesting items for you, but you can also check out the show highlights.
This year’s show consists of seven tech summits, including ESC, Sensors in Design, Black Hat, DesignMED, Android, LEDs, and Multicore. During the exhibition (see exhibitor’s list ), a number of companies will be offering free workshops right on the show floor. Here’s a sampling:
The Changing Face of Medical Connectivity utilizing TI’s Low-Cost, Low-Power Medical/Wireless Solutions
Date: Tuesday, March 27, 2012; 11:30am - 12:30pm
Location: Booth #2440
Speakers: Iboun Sylla, Business Development Manager, Low-Power RF, TI; Praveen Aroul, Applications Manager, Medical, TI
This presentation will examine the vital role that wireless technologies play in advancing new capabilities in the telehealth and consumer medical markets as well as explore implementation of a digital thermometer with a low-cost, single-chip solution from TI. As life expectancies continue to increase and diseases continue to spread, the need for more accessible, accurate, cost-efficient and connected medical monitoring devices is more evident than ever. Semiconductor companies like TI provide the integrated technologies that make equipment smaller, smarter and more affordable. What is the industry’s call to action in this process, and what part do connectivity chip designs play in the bigger picture? These questions and more will be addressed in this discussion.
Minimize Impact of Noise on Measurement Accuracy
Date: Tuesday, March 27, 2012; 11:30am - 12:30pm
Location: Booth #1328 on the Expo Floor
Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz
Noise and timing jitter within an oscilloscope acquisition system have an impact on the precision of measurements that can be made by the instrument. In this lab, we will explore the impact of noise on amplitude and jitter measurements. Two experiments will be performed that examine the measurement of a small signal level on a large amplitude signal and the timing jitter on a clock signal.
Wireless Solutions for Embedded Design
Date: Tuesday, March 27, 2012; 12:00pm - 1:00pm
Date: Wednesday, March 28, 2012; 3:00pm - 4:00pm
Date: Thursday, March 29, 2012; 12:00pm - 1:00pm
Location: Booth #1116
Presented by: Sr. Technical Training Engineer, Microchip Technology Inc.
Embedded engineers are increasingly being asked to add wireless communication to their systems. Each new implementation requires the designer to understand varying system needs such as cost, preformance and interoperability. This session presents alternatives to solve this problem: the interoperable ZigBee® protocol, the proprietary Microchip MiWiTM protocol and the ever present Wi-Fi®. Attendees will be shown the differences between these protocols and learn about the products and tools used to implement solutions.
Set Up and Use Advanced Digital Triggers
Date: Tuesday, March 27, 2012; 1:30pm - 2:30pm
Date: Tuesday, March 27, 2012; 5:30pm - 6:30pm
Date: Wednesday, March 28, 2012; 1:30pm - 2:30pm Date: Thursday, March 29, 2012; 12:30pm - 1:30pm
Location: Booth #1328
Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz
Triggering is essential to capturing and measuring signals in many applications and digital oscilloscopes provide a variety of advanced triggers for this purpose. In this lab, we will set up a runt trigger on a signal with a large overshoot and investigate how to reliably trigger on this signal. In the second part of this lab, we will use a trigger sequence to capture a specific edge of clock signal relative to a data stream.
Spectrum Analysis Using an FFT
Date: Tuesday, March 27, 2012; 3:30pm - 4:30pm
Date: Wednesday, March 28, 2012; 3:30pm - 4:30pm Location: Booth #1328 Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz
Modern digital oscilloscopes include the ability to measure the frequency spectrum of signals using a fast Fourier transform of the acquired waveform (FFT). In addition to measuring the frequency content of the signal, the spectrum is time-aligned with the signal so that one can examine the instantaneous spectrum and correlate it with what the signal is doing in time. This powerful debugging tool will be used in this lab to identify and measure signal distortions using a combined time-frequency domain display.
Minimize Impact of Noise on Measurement Accuracy
Date: Tuesday, March 27, 2012; 4:30pm - 5:30pm
Date: Wednesday, March 28, 2012; 11:30am - 12:30pm
Date: Wednesday, March 28, 2012; 4:30pm - 5:30pm
Date: Thursday, March 29, 2012; 10:30am - 11:30am
Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz
Noise and timing jitter within an oscilloscope acquisition system have an impact on the precision of measurements that can be made by the instrument. In this lab, we will explore the impact of noise on amplitude and jitter measurements. Two experiments will be performed that examine the measurement of a small signal level on a large amplitude signal and the timing jitter on a clock signal.
For more news from DESIGN West as it happens, see the breaking news site.
This year’s show consists of seven tech summits, including ESC, Sensors in Design, Black Hat, DesignMED, Android, LEDs, and Multicore. During the exhibition (see exhibitor’s list ), a number of companies will be offering free workshops right on the show floor. Here’s a sampling:
The Changing Face of Medical Connectivity utilizing TI’s Low-Cost, Low-Power Medical/Wireless Solutions
Date: Tuesday, March 27, 2012; 11:30am - 12:30pm
Location: Booth #2440
Speakers: Iboun Sylla, Business Development Manager, Low-Power RF, TI; Praveen Aroul, Applications Manager, Medical, TI
This presentation will examine the vital role that wireless technologies play in advancing new capabilities in the telehealth and consumer medical markets as well as explore implementation of a digital thermometer with a low-cost, single-chip solution from TI. As life expectancies continue to increase and diseases continue to spread, the need for more accessible, accurate, cost-efficient and connected medical monitoring devices is more evident than ever. Semiconductor companies like TI provide the integrated technologies that make equipment smaller, smarter and more affordable. What is the industry’s call to action in this process, and what part do connectivity chip designs play in the bigger picture? These questions and more will be addressed in this discussion.
Minimize Impact of Noise on Measurement Accuracy
Date: Tuesday, March 27, 2012; 11:30am - 12:30pm
Location: Booth #1328 on the Expo Floor
Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz
Noise and timing jitter within an oscilloscope acquisition system have an impact on the precision of measurements that can be made by the instrument. In this lab, we will explore the impact of noise on amplitude and jitter measurements. Two experiments will be performed that examine the measurement of a small signal level on a large amplitude signal and the timing jitter on a clock signal.
Wireless Solutions for Embedded Design
Date: Tuesday, March 27, 2012; 12:00pm - 1:00pm
Date: Wednesday, March 28, 2012; 3:00pm - 4:00pm
Date: Thursday, March 29, 2012; 12:00pm - 1:00pm
Location: Booth #1116
Presented by: Sr. Technical Training Engineer, Microchip Technology Inc.
Embedded engineers are increasingly being asked to add wireless communication to their systems. Each new implementation requires the designer to understand varying system needs such as cost, preformance and interoperability. This session presents alternatives to solve this problem: the interoperable ZigBee® protocol, the proprietary Microchip MiWiTM protocol and the ever present Wi-Fi®. Attendees will be shown the differences between these protocols and learn about the products and tools used to implement solutions.
Set Up and Use Advanced Digital Triggers
Date: Tuesday, March 27, 2012; 1:30pm - 2:30pm
Date: Tuesday, March 27, 2012; 5:30pm - 6:30pm
Date: Wednesday, March 28, 2012; 1:30pm - 2:30pm Date: Thursday, March 29, 2012; 12:30pm - 1:30pm
Location: Booth #1328
Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz
Triggering is essential to capturing and measuring signals in many applications and digital oscilloscopes provide a variety of advanced triggers for this purpose. In this lab, we will set up a runt trigger on a signal with a large overshoot and investigate how to reliably trigger on this signal. In the second part of this lab, we will use a trigger sequence to capture a specific edge of clock signal relative to a data stream.
Spectrum Analysis Using an FFT
Date: Tuesday, March 27, 2012; 3:30pm - 4:30pm
Date: Wednesday, March 28, 2012; 3:30pm - 4:30pm Location: Booth #1328 Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz
Modern digital oscilloscopes include the ability to measure the frequency spectrum of signals using a fast Fourier transform of the acquired waveform (FFT). In addition to measuring the frequency content of the signal, the spectrum is time-aligned with the signal so that one can examine the instantaneous spectrum and correlate it with what the signal is doing in time. This powerful debugging tool will be used in this lab to identify and measure signal distortions using a combined time-frequency domain display.
Minimize Impact of Noise on Measurement Accuracy
Date: Tuesday, March 27, 2012; 4:30pm - 5:30pm
Date: Wednesday, March 28, 2012; 11:30am - 12:30pm
Date: Wednesday, March 28, 2012; 4:30pm - 5:30pm
Date: Thursday, March 29, 2012; 10:30am - 11:30am
Speaker: Michael Schnecker, Business Development Manager, Rohde & Schwarz
Noise and timing jitter within an oscilloscope acquisition system have an impact on the precision of measurements that can be made by the instrument. In this lab, we will explore the impact of noise on amplitude and jitter measurements. Two experiments will be performed that examine the measurement of a small signal level on a large amplitude signal and the timing jitter on a clock signal.
For more news from DESIGN West as it happens, see the breaking news site.
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