Testing an SFR system
Once a simulation model is built that replicates the actual SFR system, it can be used for testing under real-world environments including RCS and background clutter. Moreover, the same simulation platform used to design the high-resolution SFR system can now be used for hardware receiver testing. Performing this test requires a SFR signal generator. The received signal includes target returns with environments such as ground clutter and noise.
First a test signal with two targets near each other and clutter is generated using the design in Figure 2
. The signal is then downloaded into a vector signal generator for up-conversion to RF frequencies. Next, a signal analyzer measures the input of the SFR receiver and, along with signal analysis software, uses the measured data to verify the test signal.
For SFR transmitter test, a SFR receiver is needed. The SFR receiver can be created using the simulation platform. The signal is measured using a vector signal analyzer running vector signal analysis software. The received signal is then downloaded from the signal analyzer into the EDA software for demodulation, as well as detection and recovery of the original target signals. The created SFR software receiver can be used to test real received SFR signals using the test setup in Figure 5
Figure 5. This test setup can be used for hardware test of the SFR transmitter and receiver.
Click on image to enlarge
A platform solution for simulating systems under real-world environments is the ideal tool for engineers designing, verifying and testing today’s radar systems. It is particularly useful with high-resolution Stepped Frequency Radar systems, where target detection in the presence of clutter can be difficult to analyze with closed-form solutions. The simulation platform is well suited for designing and testing SFR systems. In the latter case, a simulated software receiver can be used for transmitter component testing, while a simulated software transmitter can be used for receiver component testing.
About the author:
Dingqing Lu, Scientist – Eesof EDA, Software and Modular Solutions Division, Agilent Technologies
Dingqing Lu has been with Agilent Technologies/Hewlett Packard Company since 1989 and is a scientist with Agilent EEsof EDA, working on modeling, simulation, testing and implementation of Military and Satellite Communications and Radar EW systems. From 1981 to 1986 he was with University of Sichuan as Lecturer and Assistant Professor. He was a Research Associate in the Department of Electrical Engineering at University of California (UCLA) from 1986 to 1989. He is IEEE senior member and has published 20 papers on IEEE Transactions, Journals and Conference Proceedings. He also holds a US patent on fast DSP search algorithm. His research interests include system modeling, simulation and measurement techniques.
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