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Optimize testing safety-critical automotive parts 6/19/2013
Link synchronization and alignment in JESD204B: Understanding control characters 6/19/2013
Comprehensive EMC simulation overcomes ECU validation challenges 6/19/2013
MCUs in E-Bikes: driving lights, LED/LCD display and measurements 6/18/2013
The future of charge-trapping flash memory 6/17/2013
Signal-distortion-from-high-K-ceramic-capacitors 6/17/2013
Reflections and transmission lines 6/17/2013
The sportier side of electric vehicles 6/13/2013
Creating highly reliable FPGA designs 6/13/2013
Slideshow: Looking back at electronic test, part 3 6/13/2013
Convert your smart phone into a signal generator 6/13/2013
Measuring instantaneous RF power 6/13/2013
Adding an LCD to your microcontroller application made easy, inexpensive, & fun! 6/12/2013
Intel processor outperforms Nvidia, Qualcomm, Samsung 6/12/2013
Image sensors go organic 6/12/2013
Hynix settles with Rambus, takes license 6/12/2013
Scaling NAND flash to 20-nm node and beyond 6/10/2013
Video: Students develop tornado-seeking drones 6/10/2013
Using non-volatile memory IP in system on chip designs 6/10/2013
Voyager: The mathematics of interstellar space travel 6/10/2013
DRAM makers turn to new process for sub-nm cells 6/7/2013
Freescale expands portfolio of low-power microcontrollers for IoT 6/6/2013
Power Tip 60: Three simple split-rail power supply topologies 6/6/2013
Slideshow: Looking back at electronic test, part 2 6/6/2013
Get the most from your UI automated test suite 6/6/2013
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