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Best in Test awards highlight advances
Janine Love
2/3/2012 5:42 PM EST
On the evening of January 31, at a ceremony honoring the test and measurement industry, the editors of Test & Measurement World announced the winners of the 2012 Best in Test awards. The annual awards program, which recognizes excellence in electronics test and measurement, comprises the Best in Test, Test of Time, and Test Engineer of the Year awards. The awards ceremony took place in Santa Clara, CA, during the 2012 DesignCon show. Nominees were announced last fall, and readers were invited to vote to determine the winners.
Drum roll please....
The winners of the 2012 Best in Test awards are:
Winner Semiconductor Test: Advantest
Winner LTE Test: Spirent
Winner Multimeters: Redfish
Winner Oscilloscopes: Tektronix
Follow the jump directly to the article on Test & Measurement World to read about the 2012 Test Product of the Year, 2012 Test of Time Award, and 2012 Test Engineer of the Year.
Drum roll please....
The winners of the 2012 Best in Test awards are:
- ATE/Production Test: RFEM, Aeroflex
- Bus and Logic Analyzers: Beagle USB 5000 SuperSpeed Protocol Analyzer, Total Phase
- Data Acquisition: USB-2408 Series, Measurement Computing
- Design for Test/Boundary Scan: SFX-TAP16/G, GOEPEL electronic
- Embedded Test: TR5001T Tiny ICT, Test Research
- Functional Test: TOSCA Testsuite, TRICENTIS Technology & Consulting
- LTE Test: VR5 HD Spatial Channel Emulator , Spirent Communications
- Machine Vision/Inspection: TR7600 SII Automated X-Ray Inspection System, Test Research
- Multimeters: iDVM iPhone and iPad Enabled Wireless Multimeter , Redfish Instruments
- Optical and Network Testers: IxLoad Attack, Ixia
- Oscilloscopes: MDO4000 Mixed Domain Oscilloscope, Tektronix
- PHY Test: PVA-3000 PhyView Analyzer, Sifos Technologies
- RF/Microwave Test: URT-5000 Software Defined RF Player and Signal Generator, Averna
- Semiconductor Test: T5773 NAND Flash Package Tester, Advantest
- Signal Analyzers: PXIe-5665 VSA, National Instruments
- Signal Sources: M8190A Arbitrary Waveform Generator, Agilent Technologies
- Source-Measure Instruments: B2900A Series Precision Source/Measure Unit, Agilent Technologies
Winner Semiconductor Test: Advantest
Winner LTE Test: Spirent
Winner Multimeters: Redfish
Winner Oscilloscopes: Tektronix
Follow the jump directly to the article on Test & Measurement World to read about the 2012 Test Product of the Year, 2012 Test of Time Award, and 2012 Test Engineer of the Year.
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