Top 10 Test & Measurement articles of 2012 (so far!)

You and your fellow Test & Measurement Designline readers have voted (via your page views)—so here are the Top 10 stories that were of the greatest interest you thus far this year (and a wide variety it is!). Congratulations to all of the authors.

#1: Bridging software and hardware to accelerate SoC validation
Brad Quinton, Tektronix

#2: 802.11ac Wireless LAN: what’s new and the impact on design and test
Mirin Lew

#3: Compliance and conformance: testing to new IEEE standards
Peter Lefkin, managing director, ICAP

#4: Oscilloscopes and ENOB
Joel Woodward and Brig Asay, Agilent Technologies

#5:  Integrating traditional and modular test instruments
Larry Desjardin, Contributing Technical Editor

#6: Jitter and timing analysis in the presence of crosstalk
Chris Loberg

#7: Understanding the impact of digitizer noise on oscilloscope measurements
Jit Lim

#8: A measurement approach for IQ offset and imbalance of LTE mobile devices
Christian Kuhn

#9 Design and implementation of a low cost MCU based current loop calibration device
Abdulkadir Çakır, Fırat Yücel and Hakan Çalış

#10 New challenges for LTE and MIMO receiver test
Moray Rumney, Agilent Technologies Inc.