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Testing HDMI and MHL interfaces 3/8/2013
Agilent increases warranty on all test instruments 3/1/2013
Self-contained RF recording system weighs below 10lbs 3/1/2013
An introduction to piezo MEMS oscillators 2/26/2013
Identify the best power supply for a test application 2/25/2013
Characterizing mixed-signal ICs for production 2/21/2013
NiZn battery meets scope 2/15/2013
NI identifies latest trends in automated test 2/14/2013
Medical monitoring gets personal, goes mobile 2/14/2013
Open-source EE design tools 2/11/2013
Voice over LTE rollouts require new ways of thinking about test 2/6/2013
How healthy is your heart? 2/6/2013
Troubleshooting and verifying 8b/10b encoded signals with a real-time oscilloscope 1/17/2013
Mouser adds test gear from Keithley 1/11/2013
2012 Modular Instrument Predictions: Results 1/11/2013
National Instruments acquires LTE tester 1/2/2013
Mil-Aero top 10 'How-To' articles for 2012 12/12/2012
Memory Test Tips #3: Improving flash memory testing with pulse generators 12/10/2012
Automating communications measurement 12/3/2012
Accelerate time-to-market by saving ESD test time 11/21/2012
Bench measurements under 110dBc 3rd order intermodulation distortion 11/12/2012
How to secure your wireless network from the top 3 mobile payment threats 11/12/2012
Measuring HSIC USB without disturbing the system 10/19/2012
State of the Art in Sub-10ps Pulse Generators: Technology, Performance, and Applications 10/19/2012
Host controller gains USB-IF certification for Windows 10/16/2012

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