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5G comms research gains funding 10/10/2012
Silicon Europe seeks to boost R&D, manufacturing 10/8/2012
Testing high-speed memory with non-intrusive embedded instruments, part 2 10/1/2012
How to detect timing defects between memory and logic 9/26/2012
What engineers want in a handheld spectrum analyzer 9/26/2012
Testing high-speed memory with non-intrusive embedded instruments, part 1 9/21/2012
Europe develops space safety radar 9/20/2012
Top 10 testing challenges for the connected home 9/19/2012
Need for higher resolution oscilloscopes 9/19/2012
Speed time-to-troubleshoot, boost margins 9/18/2012
Make precision power measurements using multipath diode sensors 9/12/2012
Compare VNA and TDR performance 9/12/2012
Test for counterfeit components 9/5/2012
VTT gets onboard with electric bus research 9/5/2012
Obsolescence mitigation: An approach to a growing problem 8/29/2012
Non-invasive techniques advance electrical tests 8/28/2012
How to simulate cable in SPICE 8/15/2012
Real-world testing of Wi-Fi hotspots 8/14/2012
Tips and tricks for optimizing low current and high resistance measurements, part 2 8/10/2012
Tips and tricks for optimizing low-current and high-resistance measurements, part 1 8/8/2012
Time to streamline thermal management design and production 8/1/2012
Understanding the IP3 specification and linearity, Part 2 7/30/2012
Understanding the IP3 specification and linearity, Part 1 7/25/2012
Ensuring synchronous sampling of multiple high-frequency signal channels 7/18/2012
Spectrometer operating in visible and near-infrared 7/18/2012

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