LONDON Metrology equipment specialist Nanometrics Inc. has been granted a motion for stay in its patent litigation case brought by KLA-Tencor Corp. (San Jose, Calif.). Nanometrics said that Judge Jeffrey White in the U.S. District Court for the Northern District of California, granted the motion.
Nanometrics (Milpitas, Calif.) received a complaint alleging certain of its products infringed the intellectual property of KLA-Tencor in August 2005.
Nanometrics alleged in September 2005 that the lawsuit from KLA is motivated by competitive issues rather than a desire to protect its intellectual property and said it believes its products do not infringe any valid claims of the patents cited.
As part of its defense, Nanometrics had filed a request for re-examination of the two allegedly infringed KLA-Tencor patents with the U.S. Patent & Trademark Office. These requests for re-examination were recently accepted for review by the PTO. Subsequent to the original claim, KLA-Tencor added a third patent to their complaint. The stay issued by the court covers all three of the patents in the suit.