MANHASSET, N.Y. The VLSI Test Symposium, scheduled for April 30 to May 4 in Berkeley, Calif. will feature two keynote addresses, one from a chip house and one from an equipment vendor.
"Finding the Path To 100 Billion Transistor Devices", will be delivered on Monday, May 1, by Michael C.Mayberry, vice president of the Technology and Manufacturing Group at Intel. A second keynote address "Nanoscale Challenges in Device Test and Diagnostics" will be presented on Monday, May 1, by Vahe Sarkissian, chairman, president and CEO, FEI Company.
Topics in the technical program cover all aspects of test, including test generation & flows, test quality, yield analysis, nanoscale testing, RF, analog & mixed-signal test, wireless testing, flash & memory test and power issues in test.
An "Innovative Practices" track will highlight cutting-edge challenges faced by test practitioners, and innovative solutions on topics such as Test Strategies of Leading Edge System-on-Chips, High Test Parallelism: Throughput and Quality at a Low Cost, Nanometer IC Testing- Perspectives from Foundries, Making the(Yield) Difference: Design-for-Yield and Design-for Manufacturability.
Registration and detailed program information are available at the VTS website.