MANHASSET, N.Y. -- The IEEE will hold a town hall meeting at the NSTI Nanotech Conference 2007, next month, to discuss its completed Nanoelectronics Standards Roadmap (NESR). The roadmap establishes a framework for creating standards to help industry transition electronics applications based on nanotechnology from the laboratory to commercial use.
For 2007, the roadmap recommends the initiation of five standards: three for nanomaterials using conductive interconnects, organic sensor structures and nano-dispersions; two for nano-devices involving nanoscale sensors and nanoscale-emitting devices. It also targets the start of seven nanomaterial standards and five nano-device standards for 2008.
The town hall meeting at the NSTI Nanotech Conference will be led by the NESR co-chairs, John Tucker and Evelyn Hirt. Also on tap for the discussion will be Meyya Meyyappan, director of the Center for Nanotechnology at the NASA Ames Research Center; Alan K. Allan, staff engineer for the Intel Technology & Manufacturing Group (TMG); Paul Brazis, senior staff electrical engineer at Motorola Labs; Brent M. Segal, co-founder and chief operating officer of Nantero; and Alan Rae, VP Market & Business Development, Nanodynamics.
The nanotech community is invited to review and comment on the document.
"The standards identified in the roadmap are intended to foster industry's growth by enabling researchers to build on each other's findings, harmonize best practices, and support manufacturers across the value chain from materials, processing and test equipment to subsystems and systems," said Edward Rashba, director of IEEE-SA New Business Ventures. "These standards will build on the nanoelectronic standards efforts already underway or completed at the IEEE."
One IEEE nanoelectronics standard, IEEE 1650, "Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes," has been completed. This document, the first of its kind, provides a common template for generating reproducible electrical data on nanotubes. Organizations worldwide have aligned their characterization methods with it. A second standard, IEEE P1690, "Standard Methods for Characterization of Carbon Nanotubes Used as Additives in Bulk Materials," is being worked on.