BOSTON -- Teradyne Inc. today introduced a new capability for its VLSI logic testers that promises to lower the cost of test for local-area networking (LAN) devices.
Teradyne has added an arbitrary waveform generator (AWG) instrument on its Tiger and Catalyst line of automatic test equipment (ATE).
The capability is designed to meet the waveform generation needs of the expanding LAN market. The new AWG LAN instrument is designed with an advanced channel card that tests up to eight 100BaseT or 1000BaseT ports on Tiger (4 on Catalyst) in parallel, thereby increasing throughput and reducing cost of test.
"Teradyne's AWG LAN is the first focused LAN test solution in the ATE industry," said Rob Mosher, datacom product manager at the Boston-based company. "The demands of the increasingly competitive LAN marketplace call for new testing technologies that better address the need for higher productivity and lower cost of test," he said.
"By providing a test instrument with a high port count, combined with features like per pin measure units on each port and 8 mega samples of memory, the AWG LAN delivers the performance and economics required in this demanding marketplace," he said.
Other key features of the AWG LAN include pogo pin access, increased voltage levels and time domain characteristics aimed at the needs of the LAN market.