MUNICH -- During the Semicon Europa trade show here today, SZ Testsysteme AG and LogicVision Inc. announced a partnership in on-chip testing technology for system-on-chip products and mixed-signal IC testers.
The two companies plan to leverage LogicVision's embedded test structures for SoC chip designs with SZ Testsysteme's automatic test equipment to drive down the cost of testing complex ICs. Under the partnership, San Jose-based LogicVision will supply on-chip solutions for core test, logic, memory, and phase-locked loop (PLL) testing capabilities, while the resources of SZ Testsysteme's equipment will provide power, RF, scan, DSP and converter test capabilities.
"As new SoC devices exceed 20 million gates, the integration of different functions on an individual device is a great challenge for the test system industry," noted Juergen Zapf, president and CEO of SZ Testsysteme, based in Amerang, Germany. "Up to now high pin devices could not be tested on our test systems," he added.
During the Munich trade show, SZ Testsysteme demonstrated the embedded test capabilities using its high-speed mixed-signal tester, the M3650
The mixed-signal test alliance follows embedded test partnerships between LogicVision and other ATE suppliers, including Advantest Corp. of Japan (see April 17 story), and Credence Systems Corp. (see Feb. 10 story).