CHANDLER, Ariz.--Amkor Technology Inc. here announced development of a new radio-frequency device testing platform that reduces test times by as much as 80%. The platform uses proprietary software that optimizes standard instrumentation systems for faster RF testing results, Amkor said.
"In some cases, the combination of faster test times and reduced capital costs can reduce the test price by 80% or more," said Joe Holt, vice president of Amkor's Worldwide Test Services Group.
According to Amkor, RF testing for dual-band amplifiers (PAs) can be performed in as little as 470 milliseconds compared to as long as 1.8 seconds in a typical configurations of automatic test equipment. Low noise amplifiers (LNA) can be tested in as little as 170 ms vs. 1.3 second on typical ATE systems, said the company.
As a result of faster test times, the number of ATE systems can be reduced, lowering capital costs in operations, said Amkor, which provides testing and packaging services. Amkor said it will use the new test platform systems exclusively in its contract testing services and will not sell the systems on the market.
In addition to testing LNA and PA components, the new test platform also is suited for high-volume testing of mixers, RF switches, phase locked loops and voltage controlled oscillators, said Amkor.