PALO ALTO, Calif.-- Agilent Technologies Inc. here has expanded its line of automatic test equipment, rolling out a system for use in testing high-speed non-volatile memory devices.
Featuring a tester-per-site architecture, the V4400 NVM Test System from Agilent is a general-purpose wafer-sort and final test system designed for use in testing non-volatile memories, embedded devices, and specialty ICs.
"Demand for flash memory is growing at a remarkable pace, thanks in large part to the popularity of consumer electronics from wireless communications devices to digital cameras," said John Scruggs, senior vice-president and general manager of Agilent's Automated Test Group. "The new V4400, with its flexible architecture, really addresses manufacturers' needs for increased throughput at a reduced cost."
Compatible with the company's other Versatest line of test systems, the V4400 is optimized to handle a wide range of flash memories and related devices. It is said to be able to test up to 36 NOR devices in parallel and up to 144 NAND devices in parallel.
The 100-MHz (200-MHz in MUX mode) V4400 offers 64-pins-per-site for a total pin count of 2,304. All 36 sites are located in a single, compact test head, reducing the amount of test floor space needed. Prices of the system were not disclosed.