BEAVERTON, Ore.-- Fluence Technology Inc. today announced a new line of test-program-generation tools that works together with automatic test equipment (ATE) to accelerate the testing of system-on-chip (SOC) designs. The software tools will be unveiled at this week's International Test Conference in Atlantic City, N.J.
The new TDS iBridge product line helps companies to get devices to market on time and on budget, the company said. The first two products are designed for the Teradyne Inc. J971 and J973 testers.
The TDS iBridge products cut test development time by integrating test patterns as they are produced into one master test program. "The ability to integrate test patterns as they are generated is a feature that has been greatly anticipated by our large TDS customer base," said Mike Kondrat, vice president of marketing at Fluence Technology.
Combining test patterns eliminates the time usually spent on manually mending disjointed test programs, Kondrat explained. "By reusing common ATE resources, it is possible to optimize the test pattern integration and reduce the number of tester loads required to complete the test program."
For SOC designs, engineers can integrate test patterns from various functional blocks within the SOC into specified test equipment. Because the tester resources are optimized, the test program is easy to complete and provides higher levels of accuracy, said Fluence.
The TDS iBridge technology addresses the SOC design trend that requires the testing of many integrated blocks of IP as one-system silicon. This solution helps eliminate months of manual test program integration.
Fluence said TDS iBridge is the first test product allow to incrementally translate simulation events directly into ATE test vectors. This technology lets test program development start earlier in the design process by enabling engineers to process ATPG files and functional simulation data as it is received. This is a major improvement over previous methods, which required engineers to re-start the test development process each time new cyclized data was introduced. In addition, the TDS iBridge products allow test engineers to augment previously generated test patterns and programs.
The TDS iBridge for the Teradyne J971 and the TDS iBridge for the Teradyne J973 are each priced at $69,000, and will be available in December.