PALO ALTO, Calif.--Agilent Technologies Inc. here today introduced a low-cost test system specifically for testing high-volume RF power-amplifier ICs used in cell phones and other wireless devices.
The Agilent 84000 RFIC Series Model A20e -- which is also the first semiconductor test product to appear under the Agilent name -- is a member of the 84000 RFIC Series developed by Hewlett-Packard Co., which spun off Agilent as a separate test and measurement systems company earlier this year. The company is demonstrating the system this week at Semicon Japan `99.
"As wireless devices explode in popularity, high-quantity chip manufacturers need low-cost, focused test solutions to stay competitive," said John Scruggs, vice president and general manger of Agilent's Automated Test Group. "We extracted proven technology from the 84000 RFIC Series to develop an off-the-shelf system that provides engineers with the most efficient and cost-effective solution available for verifying power amplifiers."
To lower the test cost, the system supports dual-site testing, and test plans can be created quickly using menu-driven templates. "The user need not write code to test a device." explained Scruggs. "Hence, the A20e is ideally suited to the cost andtime requirements of high-volume chip production."
The Model A20e is a two-port system with a vector measurement from 750 MHz to 3 GHz and scalar measurements up to 8GHz. It is compliant with CDMA, NADC, PDC, PHS, GSM, DECT, and TETRA wireless communication standards. A20e measurements include input/output power, gain, ACPR, harmonics, S-parameters, current and voltage.
The total solution includes installation, device handler drivers, site acceptance, operator training and "first year" uptime support. The Agilent 84000 RFIC Series Model A20e is available now, with a base price starting at under $400,000.