BOSTON -- Teradyne Inc. today (Sept. 29, 2003) announced that GuideTech Inc. has released the first commercial, third-party instrument for its Integra Flex line of IC-test equipment.
GuideTech's Femto 2000 family of multi-channel, time measurement units provide direct timing analysis for ATE. The instrument is now available from GuideTech. The Sunnyvale, Calif.-based supplier of instruments is also developing similar products for NPTest, LTX, and the Intel-Advantest ATE consortium, dubbed the Semiconductor Test Consortium (STC).
The Femto 2000 is the first third-party instrument for the Integra Flex IC tester, under Teradyne's "OpenFlex" initiative. Last year, Teradyne announced a new initiative that promised to bolster the capabilities of its new IC tester.
Teradyne's new initiative enables third parties to both co-operatively and independently develop and market instrumentation options for the company's new Integra Flex line of ATE. Last year, Teradyne introduced the modular Integra Flex line of ATE. The tester is designed to test high-volume, system-on-a-chip and other complex devices (see May 20, 2002 story).
"What's unique about this solution is that access to the Femto is natively available from within IG-XL," said Mark Kohalmy, OpenFLEX business development manager at Teradyne, in a statement. "The key issue for any open architecture, in the ATE industry or anywhere else, is whether or not you can integrate into the operating system. GuideTech developed the software that was integrated directly into IG-XL giving full access to the Femto from within the customer's test program."