FREMONT, Calif. -- Credence Systems Corp. today (October 28, 2003) introduced a high-volume, production test system for emerging non-volatile (NVM) memory devices.
Based on Credence's Tester-on-a-Chip (ToC) architecture, Credence's Kalos 2 is said to have data rates up to 200-MHz. The Kalos 2 is geared to test NOR, NAND, serial flash and embedded flash memories, as well as smart cards and highly-integrated devices with large flash arrays and digital logic.
"Increasing demand for more intelligent personal electronic devices, such as cellular phones and PDAs, has driven NVM to higher volume, density and performance levels," said Graham Siddall, Credence's chairman and chief executive officer, in a statement. "These devices have created significant challenges that require test solutions with greater flexibility and the capability to support higher frequencies and faster data rates."
Kalos 2 is compatible with the company's Personal Kalos 2, which is an engineering test system designed for advanced NVM devices. The tester can accommodate up to 72 sites, supported by a full set of test resources.
Each pin on the tester is programmable and independent, permitting software configuration as either input or I/O. Engineers can combine through software the test resources to test one site with 48, 96, 192, 384 or up to 768 I/O pins.
This flexibility, combined with 32 M of vector memory per pin, enhances Kalos 2's ability to address a wide array of devices that require both algorithmic pattern generation (APG) for memory test and vector generation, or scan for digital logic test. Additional modules offer fully adaptive independent programming per site and provide an APG, tester controller CPU, data buffer memory, unrestricted at-speed error capture RAM, a parametric measurement unit, and redundancy analysis for every site.