Tokyo, Japan--November 20, 1996--The Memory Test Division of Teradyne Inc. (Agoura Hills, CA) introduced its new J996 Memory Test System. The J996 is a high-performance test system for engineering characterization and volume packaged-device test of RAMs operating at speeds up to 250 MHz, including standard DRAMs, synchronous DRAMs, and synchronous SRAMs. Typical pricing for the J996 system is under $2 million for volume purchases. Shipments of J996 systems are scheduled to begin in the first quarter of 1997 to customers in the U.S., Europe, and Asia.
The J996 uses Teradyne's IG900+ software system, and is fully compatible with other J990 Series memory test systems. IG900+, which also used in Teradyne's VLSI test systems, provides a full suite of graphical engineering software tools and templates optimized for production testing. Parallel testing is integrated in the IG900+ executive software which provides efficient program development, and control of test flow and binning.
30801 Agoura Rd.
Agoura Hills, CA 91301
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