Westwood, MA--May 29, 1997-- LTX Corp. (Westwood, MA), a supplier of semiconductor test equipment, announced that it has received a multi-million dollar order from National Semiconductor's Sort Operations Group for multiple LTX Delta/STE systems. National Semiconductor (Santa Clara, CA) will use the Delta STEs beginning in June 1997 to test "system-on-a-chip" devices in its new 8-in. fab facility located in South Portland, Maine.
The Delta/STE systems are 384-pin configurations and include a number of mixed-signal test options running on the LTX enVision software platform. The Delta/STE is a 125/200 MHz test system which supports up to 512 I/O pins and pattern memory depths up to 16M vectors. The mixed-signal test options, part of a joint development effort between LTX's Mixed Signal and Digital Products Divisions, leverage the company's Synchro technology for testing "system-on-a-chip" devices.
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