Ottawa, Canada--May 22, 1997--MOSAID Technologies Inc. (Ottawa, Canada) announced the first shipments at the end of the fourth quarter of the MS4105 engineering test systems, designed specifically for testing Synchronous Dynamic Random Access Memory (SDRAM) devices.
Engineered as a flexible SDRAM testing alternative, MOSAID's MS4105 engineering test system provides a completely interactive and easy-to-use test environment that reduces the SDRAM product development cycle. It is designed to perform device characterization, design verification, and yield improvement tests, and present results in a concise and accurate format.
The system combines the ease of use of MOSAID's MS3495 test systems with the enhanced speeds and specialized development tools required for SDRAM testing. It provides functional, AC parametric and DC parametric testing at data rates up to 104 MHz and clock rates up to 156 MHz. New development tools include a Graphical Sequence Editor, Pattern Sequence Selector, Multiple Timeset Display, and an Advanced Pattern Debug Utility.
MOSAID's MS4105 system is controlled and managed with a completely interactive Windows 95 interface.
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