Viewlogic Announces Next-Generation Memory Bist Tool
Marlboro, Mass.--Oct. 27, 1997--Viewlogic Systems, Inc. introduced Sunrise MemBIST, a production-proven, built-inself test (BIST) tool for embedded memories. It is completelyintegrated into the Sunrise TestGen suite of tools. SunriseMemBIST is based on patented, next-generation memory BISTtechnology that considers the critical requirements of fault diagnosis,built-in self repair, and algorithm programmability required to testthe memories in today's complex integrated circuits (IC). This combinationof features has not been previously available in any commerciallyobtainable memory BIST tool. In addition, the breadth of memory designsupport is unique, and includes testing capabilities for embeddedSRAM, ROM,and DRAM-type memories.
Today's system-on-silicon and core-based design styles drive theintegration of logic and memory within a single device. An increasingpercentage of the silicon area in a complex IC is embedded memory.However, testing of the embedded memories within these complex ICs isincreasingly difficult. Adding test access to the embedded memoriesincreases design size and complexity, while the increased number oftest patterns needed for the memory test increases production cost.Automated solutions are necessary to support lower production costswhile allowing increasing design functionality.
Built-in self-test techniques for memory offers a solution to thetest problem. Test logic is embedded near the memories and facilitatesan automated test of each embedded memory. Memory BIST eliminates theburden of memory test vector development while providing an automatic,high-quality test.
Using Sunrise MemBIST, design engineers select thecharacteristics of their embedded memory through an easy-to-usegraphical user interface. Sunrise MemBIST automatically generatesregister transfer level (RTL) code for the logic blocks in the memoryBIST framework structure. The RTL code is automatically verified witha test bench, then synthesized using a commercial design synthesistool. Direct links are provided to verify the logic function andtiming usingViewlogic's Chronologic VCS and MOTIVE toolsrespectively.
The Sunrise MemBIST tool comes complete with the softwarenecessary to generate built-in self test design elements and testbench for SRAM and ROM type memories. Product options for DRAM BISTand diagnosis are also available. Sunrise MemBIST is scheduled to beavailable in November 1997.
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